Abstract: An optoelectronically functional multilayer structure as well as related methods of manufacturing an optoelectronically functional multilayer structure are described herein.

Abstract: An optoelectronically functional multilayer structure and related methods of manufacturing an optoelectronically functional multilayer structure, such structure including an optionally thermoplastic formable substrate film, electronics comprising preferably light-emitting and/or light-sensitive elements, an optically transmissive layer, and a light-blocking layer defining a number of structural channels extending in at least a first direction.

Abstract: A testing apparatus for testing a device. In accordance with an embodiment the testing apparatus includes a base part; a testing head; first movement rails attached with the base part; a first movement platform positioned on top of the first movement rails adapted to enable movement of the first movement platform in a first direction; a second movement platform attached with the first movement platform so that the second movement platform is adapted to be movable in a second direction transverse to the first direction; a first support adapted to be movable in a third direction transverse to the first direction and the second direction; a movement mechanism for moving the testing head; and a second support attached with the vertical support for supporting the movement mechanism and the testing head. The movement mechanism comprises a first axis for pivoting the testing head; a second axis for tilting the testing head; and a third axes for rotating the testing head.