Patents by Inventor Tuomo YLITALO

Tuomo YLITALO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10234266
    Abstract: A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining (501) a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming (502) calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (503), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.
    Type: Grant
    Filed: October 29, 2015
    Date of Patent: March 19, 2019
    Assignees: ABO AKADEMI (ABO AKADEMI UNIVERSITY), HELSINGIN YLIOPISTO
    Inventors: Edward Hæggstrom, Ivan Kassamakov, Anton Nolvi, Tuomo Ylitalo, Niklas Sandler, Tapani Viitala, Johan Nyman
  • Publication number: 20180256089
    Abstract: An assessment method is disclosed to determine at least one of macro-topology, milli-topology, micro-topology and nano-topology of at least one interface of at least two media using topology of the interface. Topology information of the interface is processed by performing segmentation of volume information of the obtained information from background information of the obtained information. Reference surface information is generated and information on voids is obtained and analyzed to provide multivalued surface shape information. Quantitative mapping of the information on voids is performed using the multivalued surface shape information for determining at least one of macro-topology, milli-topology, micro-topology and nano-topology of the interface.
    Type: Application
    Filed: May 11, 2018
    Publication date: September 13, 2018
    Applicant: University of Oulu
    Inventors: Heikki Nieminen, Tuomo Ylitalo, Simo Saarakkala, Edward Haeggström
  • Publication number: 20170261309
    Abstract: A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining (501) a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming (502) calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (503), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.
    Type: Application
    Filed: October 29, 2015
    Publication date: September 14, 2017
    Inventors: Edward HÆGGSTROM, Ivan KASSAMAKOV, Anton NOLVI, Tuomo YLITALO, Niklas SANDLER, Tapani VIITALA, Johan NYMAN