Patents by Inventor Tuyen K. Tran

Tuyen K. Tran has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • WAFER LEVEL ELECTRON BEAM PROBER
    Publication number: 20230305057
    Abstract: Wafer level electron beam prober systems, devices, and techniques, are described herein related to providing wafer level testing for fabricated device structures. Such wafer level testing contacts a first side of a die of a wafer with a probe to provide test signals to the die under test and performs e-beam imaging of the first side of the die while the test signals are provided to the die under test.
    Type: Application
    Filed: March 22, 2022
    Publication date: September 28, 2023
    Applicant: Intel Corporation
    Inventors: Xianghong Tong, Martin Von Haartman, Zhiyong Ma, Jennifer J. Huening, Hyuk Ju Ryu, Christopher Morgan, Shuai Zhao, Ramune Nagisetty, Tuyen K. Tran, Wen-Hsien Chuang