Patents by Inventor Tuyoshi Matumura

Tuyoshi Matumura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities
    Patent number: 5636256
    Abstract: An apparatus is disclosed which is used for total reflection fluorescent X-ray analysis on a liquid drop-like sample containing very small amounts of impurities. The apparatus comprises a heat-resistant thin sheet containing an element or elements, as a principal component, not detected on total reflection fluorescent X-ray analysis and an x-ray source directing an X-ray as an incident X-ray at a liquid drop-like sample put on the sheet and containing very small amounts of impurities whereby the liquid drop-like sample is evaporated to a dried solid for the total reflection fluorescent X-ray analysis to be performed there.
    Type: Grant
    Filed: August 30, 1996
    Date of Patent: June 3, 1997
    Assignees: Kabushiki Kaisha Toshiba, Purex Co., Ltd.
    Inventors: Tuyoshi Matumura, Kunihiro Miyazaki, Hisashi Muraoka