Patents by Inventor Tyler B. Niles

Tyler B. Niles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11650225
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Grant
    Filed: November 30, 2021
    Date of Patent: May 16, 2023
    Assignee: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20220196701
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: November 30, 2021
    Publication date: June 23, 2022
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Patent number: 11187720
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Grant
    Filed: June 18, 2018
    Date of Patent: November 30, 2021
    Assignee: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Publication number: 20200200794
    Abstract: A test and measurement system can include a data store configured to store augmentation settings for dynamically augmenting a physical testing environment and a computing device coupled to the data store. The computing device can be configured to receive an input feed from the physical testing environment, create an augmentation image based on the augmentation settings and the input feed, and output the augmented image to be overlaid on the physical testing environment to augment a user's view of the physical testing environment.
    Type: Application
    Filed: June 18, 2018
    Publication date: June 25, 2020
    Applicant: Tektronix, Inc.
    Inventors: Tyler B. Niles, Daniel G. Knierim, Michael J. Wadzita, Joshua J. O'Brien, David Everett Burgess
  • Patent number: 9709605
    Abstract: A test and measurement instrument configured to receive at least one input signal is disclosed. The test and measurement instrument includes a processor configured to sample the input signal and generate a plurality of measurements. The processor is configured to generate a measurement ticker having a plurality of ticker elements configured for presentation on a display in a serial, scrolling fashion. Each ticker element has a measurement value associated with the input signal. The processor may be configured to sample a plurality of input signals and each ticker element may include a measurement value associated with at least one of the plurality of input signals. Each ticker element may further comprise a source ID and a measurement type.
    Type: Grant
    Filed: December 12, 2012
    Date of Patent: July 18, 2017
    Assignee: Tektronix, Inc.
    Inventors: James D. Alley, Tyler B. Niles
  • Patent number: 9134347
    Abstract: A test and measurement instrument and method of detecting an anomaly in a test and measurement instrument are disclosed. The test and measurement instrument includes an input terminal configured to receive a signal. An acquisition engine is coupled to the input terminal, the acquisition engine being configured to digitize the signal and store the digitized signal as a signal history in an acquisition memory based on initial trigger settings. An anomaly detector is coupled to the acquisition memory, the anomaly detector being configured to detect an anomaly in the signal history. An analysis engine is coupled to the anomaly detector, the analysis engine being configured to analyze the anomaly detected in the signal history and generate modified trigger settings for detecting the anomaly. Trigger circuitry is coupled to the analysis engine, the trigger circuitry being configured to trigger based on the modified trigger settings.
    Type: Grant
    Filed: October 1, 2012
    Date of Patent: September 15, 2015
    Assignee: TEKTRONIX, INC.
    Inventors: Tyler B. Niles, Craig H. Nelson, James D. Alley
  • Publication number: 20140163914
    Abstract: A test and measurement instrument configured to receive at least one input signal is disclosed. The test and measurement instrument includes a processor configured to sample the input signal and generate a plurality of measurements. The processor is configured to generate a measurement ticker having a plurality of ticker elements configured for presentation on a display in a serial, scrolling fashion. Each ticker element has a measurement value associated with the input signal. The processor may be configured to sample a plurality of input signals and each ticker element may include a measurement value associated with at least one of the plurality of input signals. Each ticker element may further comprise a source ID and a measurement type.
    Type: Application
    Filed: December 12, 2012
    Publication date: June 12, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: James D. Alley, Tyler B. Niles
  • Publication number: 20140095098
    Abstract: A test and measurement instrument and method of detecting an anomaly in a test and measurement instrument are disclosed. The test and measurement instrument includes an input terminal configured to receive a signal. An acquisition engine is coupled to the input terminal, the acquisition engine being configured to digitize the signal and store the digitized signal as a signal history in an acquisition memory based on initial trigger settings. An anomaly detector is coupled to the acquisition memory, the anomaly detector being configured to detect an anomaly in the signal history. An analysis engine is coupled to the anomaly detector, the analysis engine being configured to analyze the anomaly detected in the signal history and generate modified trigger settings for detecting the anomaly. Trigger circuitry is coupled to the analysis engine, the trigger circuitry being configured to trigger based on the modified trigger settings.
    Type: Application
    Filed: October 1, 2012
    Publication date: April 3, 2014
    Applicant: TEKTRONIX, INC.
    Inventors: Tyler B. Niles, Craig H. Nelson, James D. Alley