Patents by Inventor Tyler G. HANSEN
Tyler G. HANSEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10840137Abstract: Methods of forming integrated circuits forming a first conductive structure at a first level of the integrated circuit, forming a first conductor at a second level of the integrated circuit to be in physical and electrical contact with the first conductive structure, forming a second conductor at the second level to be in physical and electrical contact with the first conductive structure and to be parallel to the first conductor, forming a third conductor at the second level to be isolated from the first conductive structure and to be parallel to the first conductor and to the second conductor, and forming a second conductive structure at a third level of the integrated circuit to be in physical and electrical contact with the second conductor and with the third conductor, wherein the second level is between the first level and the third level.Type: GrantFiled: July 24, 2019Date of Patent: November 17, 2020Assignee: Micron Technology, Inc.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Patent number: 10741445Abstract: Integrated circuits include a first conductive structure at a first level of the integrated circuit, a second conductive structure at a second level of the integrated circuit, a first conductor at a third level of the integrated circuit between the first level and the second level, a second conductor at the third level and parallel to the first conductor, and a third conductor at the third level and parallel to the first conductor and to the second conductor. The first conductive structure is in physical and electrical contact with the first conductor and the second conductor. The second conductive structure is in physical and electrical contact with the second conductor and the third conductor.Type: GrantFiled: July 24, 2019Date of Patent: August 11, 2020Assignee: Micron Technology, Inc.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Publication number: 20190348321Abstract: Methods of forming integrated circuits forming a first conductive structure at a first level of the integrated circuit, forming a first conductor at a second level of the integrated circuit to be in physical and electrical contact with the first conductive structure, forming a second conductor at the second level to be in physical and electrical contact with the first conductive structure and to be parallel to the first conductor, forming a third conductor at the second level to be isolated from the first conductive structure and to be parallel to the first conductor and to the second conductor, and forming a second conductive structure at a third level of the integrated circuit to be in physical and electrical contact with the second conductor and with the third conductor, wherein the second level is between the first level and the third level.Type: ApplicationFiled: July 24, 2019Publication date: November 14, 2019Applicant: MICRON TECHNOLOGY, INC.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Publication number: 20190348320Abstract: Integrated circuits include a first conductive structure at a first level of the integrated circuit, a second conductive structure at a second level of the integrated circuit, a first conductor at a third level of the integrated circuit between the first level and the second level, a second conductor at the third level and parallel to the first conductor, and a third conductor at the third level and parallel to the first conductor and to the second conductor. The first conductive structure is in physical and electrical contact with the first conductor and the second conductor. The second conductive structure is in physical and electrical contact with the second conductor and the third conductor.Type: ApplicationFiled: July 24, 2019Publication date: November 14, 2019Applicant: MICRON TECHNOLOGY, INC.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Patent number: 10424506Abstract: Integrated circuits, as well as methods of their formation, include a first conductive structure at a first level of the integrated circuit, a second conductive structure at a second level of the integrated circuit, a first conductor at a third level of the integrated circuit between the first level and the second level, a second conductor at the third level and parallel to the first conductor, and a third conductor at the third level and parallel to the first conductor and to the second conductor. The first conductive structure is in physical and electrical contact with the first conductor and the second conductor. The second conductive structure is in physical and electrical contact with the second conductor and the third conductor.Type: GrantFiled: May 8, 2018Date of Patent: September 24, 2019Assignee: Micron Technology, Inc.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Publication number: 20180254214Abstract: Integrated circuits, as well as methods of their formation, include a first conductive structure at a first level of the integrated circuit, a second conductive structure at a second level of the integrated circuit, a first conductor at a third level of the integrated circuit between the first level and the second level, a second conductor at the third level and parallel to the first conductor, and a third conductor at the third level and parallel to the first conductor and to the second conductor. The first conductive structure is in physical and electrical contact with the first conductor and the second conductor. The second conductive structure is in physical and electrical contact with the second conductor and the third conductor.Type: ApplicationFiled: May 8, 2018Publication date: September 6, 2018Applicant: MICRON TECHNOLOGY, INC.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Patent number: 9972532Abstract: An embodiment of an interconnect structure for an integrated circuit may include a first conductor coupled to circuitry, a second conductor, a dielectric between the first and second conductors, and a conductive underpass under and coupled to the first and second conductors and passing under the dielectric or a conductive overpass over and coupled to the first and second conductors and passing over the dielectric. The second conductor would be floating but for its coupling to the conductive underpass or the conductive overpass. In other embodiments, another dielectric might be included that would electrically isolate the second conductor but for its coupling to the conductive underpass or the conductive overpass.Type: GrantFiled: October 20, 2015Date of Patent: May 15, 2018Assignee: Micron Technology, Inc.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Publication number: 20160042995Abstract: An embodiment of an interconnect structure for an integrated circuit may include a first conductor coupled to circuitry, a second conductor, a dielectric between the first and second conductors, and a conductive underpass under and coupled to the first and second conductors and passing under the dielectric or a conductive overpass over and coupled to the first and second conductors and passing over the dielectric. The second conductor would be floating but for its coupling to the conductive underpass or the conductive overpass. In other embodiments, another dielectric might be included that would electrically isolate the second conductor but for its coupling to the conductive underpass or the conductive overpass.Type: ApplicationFiled: October 20, 2015Publication date: February 11, 2016Applicant: MICRON TECHNOLOGY, INC.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Patent number: 9177910Abstract: An embodiment of an interconnect structure for an integrated circuit may include a first conductor coupled to circuitry, a second conductor, a dielectric between the first and second conductors, and a conductive underpass under and coupled to the first and second conductors and passing under the dielectric or a conductive overpass over and coupled to the first and second conductors and passing over the dielectric. The second conductor would be floating but for its coupling to the conductive underpass or the conductive overpass. In other embodiments, another dielectric might be included that would electrically isolate the second conductor but for its coupling to the conductive underpass or the conductive overpass.Type: GrantFiled: April 18, 2012Date of Patent: November 3, 2015Assignee: Micron Technology, Inc.Inventors: Tyler G. Hansen, Ming-Chuan Yang, Vishal Sipani
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Publication number: 20130277822Abstract: An embodiment of an interconnect structure for an integrated circuit may include a first conductor coupled to circuitry, a second conductor, a dielectric between the first and second conductors, and a conductive underpass under and coupled to the first and second conductors and passing under the dielectric or a conductive overpass over and coupled to the first and second conductors and passing over the dielectric. The second conductor would be floating but for its coupling to the conductive underpass or the conductive overpass. In other embodiments, another dielectric might be included that would electrically isolate the second conductor but for its coupling to the conductive underpass or the conductive overpass.Type: ApplicationFiled: April 18, 2012Publication date: October 24, 2013Inventors: Tyler G. HANSEN, Ming-Chuan Yang, Vishal Sipani