Abstract: Embodiments described herein provide enhanced testing of devices. For example, in an embodiment, an interposer for testing devices is provided. The interposer includes a substrate, a first plurality of connection elements located on a surface of the substrate, and a memory device electrically coupled to the first plurality of connection elements through the substrate. The first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test. The memory device is configured to store information received from the device under test and to output stored information to the device under test.

Abstract: Embodiments described herein provide enhanced testing of devices. For example, in an embodiment, an interposer for testing devices is provided. The interposer includes a substrate, a first plurality of connection elements located on a surface of the substrate, and a memory device electrically coupled to the first plurality of connection elements through the substrate. The first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test. The memory device is configured to store information received from the device under test and to output stored information to the device under test.

Abstract: A method for displaying data received from automated testing equipment is disclosed. The method includes the steps of receiving data output from automated testing equipment, processing a predetermined integer number of samples of the received data, displaying the predetermined integer number of samples on a graph, the graph showing magnitudes of the samples versus a time scale, and wrapping additional samples of the received data on top of the displayed graph to provide an eye pattern. The eye pattern allows for evaluation of the data output from the automated testing equipment.