Patents by Inventor Tzu-Lang Shih

Tzu-Lang Shih has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SEMICONDUCTOR DEVICE INCLUDING GATE OXIDE LAYER
    Publication number: 20230207647
    Abstract: A semiconductor device includes a semiconductor substrate, a first gate oxide layer, and a first source/drain doped region. The first gate oxide layer is disposed on the semiconductor substrate, and the first gate oxide layer includes a main portion and an edge portion having a sloping sidewall. The first source/drain doped region is disposed in the semiconductor substrate and located adjacent to the edge portion of the first gate oxide layer. The first source/drain doped region includes a first portion and a second portion. The first portion is disposed under the edge portion of the first gate oxide layer in a vertical direction, and the second portion is connected with the first portion.
    Type: Application
    Filed: March 1, 2023
    Publication date: June 29, 2023
    Applicant: UNITED MICROELECTRONICS CORP.
    Inventors: Ming-Hua Tsai, Jung Han, Ming-Chi Li, Chih-Mou Lin, Yu-Hsiang Hung, Yu-Hsiang Lin, Tzu-Lang Shih
  • Semiconductor device including gate oxide layer and manufacturing method thereof
    Patent number: 11626500
    Abstract: A semiconductor device includes a semiconductor substrate, a first gate oxide layer, and a first source/drain doped region. The first gate oxide layer is disposed on the semiconductor substrate, and the first gate oxide layer includes a main portion and an edge portion having a sloping sidewall. The first source/drain doped region is disposed in the semiconductor substrate and located adjacent to the edge portion of the first gate oxide layer. The first source/drain doped region includes a first portion and a second portion. The first portion is disposed under the edge portion of the first gate oxide layer in a vertical direction, and the second portion is connected with the first portion.
    Type: Grant
    Filed: July 8, 2021
    Date of Patent: April 11, 2023
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Ming-Hua Tsai, Jung Han, Ming-Chi Li, Chih-Mou Lin, Yu-Hsiang Hung, Yu-Hsiang Lin, Tzu-Lang Shih
  • MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
    Publication number: 20230105690
    Abstract: A semiconductor device includes a semiconductor substrate, a first gate oxide layer, and a first source/drain doped region. The first gate oxide layer is disposed on the semiconductor substrate, and the first gate oxide layer includes a main portion and an edge portion having a sloping sidewall. The first source/drain doped region is disposed in the semiconductor substrate and located adjacent to the edge portion of the first gate oxide layer. The first source/drain doped region includes a first portion and a second portion. The first portion is disposed under the edge portion of the first gate oxide layer in a vertical direction, and the second portion is connected with the first portion.
    Type: Application
    Filed: December 8, 2022
    Publication date: April 6, 2023
    Applicant: UNITED MICROELECTRONICS CORP.
    Inventors: Ming-Hua Tsai, Jung Han, Ming-Chi Li, Chih-Mou Lin, Yu-Hsiang Hung, Yu-Hsiang Lin, Tzu-Lang Shih
  • SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
    Publication number: 20220376071
    Abstract: A semiconductor device includes a semiconductor substrate, a first gate oxide layer, and a first source/drain doped region. The first gate oxide layer is disposed on the semiconductor substrate, and the first gate oxide layer includes a main portion and an edge portion having a sloping sidewall. The first source/drain doped region is disposed in the semiconductor substrate and located adjacent to the edge portion of the first gate oxide layer. The first source/drain doped region includes a first portion and a second portion. The first portion is disposed under the edge portion of the first gate oxide layer in a vertical direction, and the second portion is connected with the first portion.
    Type: Application
    Filed: July 8, 2021
    Publication date: November 24, 2022
    Applicant: UNITED MICROELECTRONICS CORP.
    Inventors: Ming-Hua Tsai, Jung Han, Ming-Chi Li, Chih-Mou Lin, Yu-Hsiang Hung, Yu-Hsiang Lin, Tzu-Lang Shih