Patents by Inventor Udit Vyas

Udit Vyas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory device defect scanning
    Patent number: 11922025
    Abstract: A method includes determining that a criteria involving a memory device is met and performing a defect scan involving memory dice of the memory device in response to the criteria being met. The method further includes determining, as part of performing the defect scan, whether at least one memory die of the memory device has experienced degradation. The defect scan is performed as part of a quality and reliability assurance test or a reliability demonstration test, or both.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: March 5, 2024
    Assignee: Micron Technology, Inc.
    Inventor: Udit Vyas