Patents by Inventor Ui Won Suh
Ui Won Suh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8269489Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.Type: GrantFiled: November 25, 2008Date of Patent: September 18, 2012Assignee: General Electric CompanyInventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
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Patent number: 8013599Abstract: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.Type: GrantFiled: November 19, 2004Date of Patent: September 6, 2011Assignee: General Electric CompanyInventors: Ui Won Suh, Gigi Olive Gambrell, John William Ertel, William Stewart McKnight
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Patent number: 7948233Abstract: Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.Type: GrantFiled: October 7, 2008Date of Patent: May 24, 2011Assignee: General Electric CompanyInventors: Aparna Chakrapani Sheila-Vadde, Ui Won Suh, Changting Wang
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Patent number: 7817845Abstract: A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.Type: GrantFiled: December 29, 2006Date of Patent: October 19, 2010Assignee: General Electric CompanyInventors: Ui Won Suh, Gigi Olive Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra, Sandeep Kumar Dewangan, Changting Wang
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Publication number: 20100127699Abstract: An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part.Type: ApplicationFiled: November 25, 2008Publication date: May 27, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Changting Wang, Yury Alexeyevich Plotnikov, Ui Won Suh, William Stewart McKnight
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Publication number: 20100085045Abstract: Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response.Type: ApplicationFiled: October 7, 2008Publication date: April 8, 2010Applicant: GENERAL ELECTRIC COMPANYInventors: Aparna Chakrapani Sheila-Vadde, Ui Won Suh, Changting Wang
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Patent number: 7689030Abstract: A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.Type: GrantFiled: December 21, 2005Date of Patent: March 30, 2010Assignee: General Electric CompanyInventors: Ui Won Suh, Gigi Olive Gambrell, William McKnight, Preeti Pisupati
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Patent number: 7436992Abstract: A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.Type: GrantFiled: July 30, 2004Date of Patent: October 14, 2008Assignee: General Electric CompanyInventors: Ui Won Suh, Gigi Olive Gambrell, John William Ertel, William Stewart McKnight
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Publication number: 20080159619Abstract: A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.Type: ApplicationFiled: December 29, 2006Publication date: July 3, 2008Applicant: GENERAL ELECTRIC COMPANYInventors: Ui Won SUH, Gigi Olive GAMBRELL, William Stewart MCKNIGHT, Preeti PISUPATI, Peyush Kumar MISHRA, Sandeep Kumar DEWANGAN, Changting WANG
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Patent number: 7337651Abstract: A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.Type: GrantFiled: April 5, 2005Date of Patent: March 4, 2008Assignee: General Electric CompanyInventors: Suneel Tumkur Shankarappa, William Stewart McKnight, Vamshi Krishna Reddy Kommareddy, Ui Won Suh, Mandar Diwakar Godbole, Anjani Narendra Schrad, Prafull Sharma
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Publication number: 20070244659Abstract: A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.Type: ApplicationFiled: August 23, 2006Publication date: October 18, 2007Applicant: General Electric CompanyInventors: Ui Won Suh, Richard C. Knepfle
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Patent number: 7154265Abstract: An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.Type: GrantFiled: December 21, 2004Date of Patent: December 26, 2006Assignee: General Electric CompanyInventors: Mottito Togo, Changting Wang, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter Joseph Bantz, Ui Won Suh
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Patent number: 6914215Abstract: A real time method for quality control testing of a laser shock peening process of production workpieces by analysis of natural frequency shifts during the laser shock peening process. One particular embodiment includes laser shock peening surface of the production workpiece by firing a plurality of laser beam pulses on the surface and forming a plurality of corresponding plasmas, each one of the plasmas pulses having a duration in which the plasma causes a region having deep compressive residual stresses to form beneath the surface, measuring at least one natural frequency of the workpiece for each of the laser beam pulses, calculating natural frequency shifts from a baseline natural frequency for the measured natural frequencies for at least a portion of the laser beam pulses, and using the natural frequency shifts for accepting or rejecting the workpiece with respect to pass or fail criteria.Type: GrantFiled: June 27, 2003Date of Patent: July 5, 2005Assignee: General Electric CompanyInventors: Brian Michael Davis, Robert David McClain, Ui Won Suh, Seetha Ramaiah Mannava
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Patent number: 6907358Abstract: A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.Type: GrantFiled: January 30, 2003Date of Patent: June 14, 2005Assignee: General Electric CompanyInventors: Ui Won Suh, Clifford Sneed, Jr.
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Publication number: 20040262276Abstract: A real time method for quality control testing of a laser shock peening process of production workpieces by analysis of natural frequency shifts during the laser shock peening process. One particular embodiment includes laser shock peening surface of the production workpiece by firing a plurality of laser beam pulses on the surface and forming a plurality of corresponding plasmas, each one of the plasmas pulses having a duration in which the plasma causes a region having deep compressive residual stresses to form beneath the surface, measuring at least one natural frequency of the workpiece for each of the laser beam pulses, calculating natural frequency shifts from a baseline natural frequency for the measured natural frequencies for at least a portion of the laser beam pulses, and using the natural frequency shifts for accepting or rejecting the workpiece with respect to pass or fail criteria.Type: ApplicationFiled: June 27, 2003Publication date: December 30, 2004Inventors: Brian Michael Davis, Robert David McClain, Ui Won Suh, Seetha Ramaiah Mannava
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Publication number: 20040153260Abstract: A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.Type: ApplicationFiled: January 30, 2003Publication date: August 5, 2004Inventors: Ui Won Suh, Clifford Sneed
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Patent number: 6629464Abstract: A method for quality control monitoring of laser shock peening a surface of a production workpiece during which laser beam pulses form a plurality of corresponding plasmas. An acoustic signal of each laser beam pulse during a period of time during a duration of each corresponding one of the plasmas is monitored and an acoustic energy parameter value for each of the acoustic signals for each of the corresponding laser pulses is calculated. A statistical function value of the workpiece based on the acoustic energy parameter values is calculated and compared to a pass or fail criteria for accepting or rejecting the workpiece. The criteria may be based on a pre-determined correlation of test piece statistical function data such as high cycle fatigue failure data of test pieces. The statistical function value may be an average of the acoustic energy parameter values of the laser beam pulses.Type: GrantFiled: October 3, 2001Date of Patent: October 7, 2003Inventors: Ui Won Suh, James Douglas Risbeck
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Patent number: 6570126Abstract: A method for laser shock peening an article by simultaneously firing low energy first and second laser beams to form pairs of longitudinally spaced apart first and second laser shock peened spots that are on opposite sides of the article, simultaneously laser shock peened, and transversely offset from each other. Each of the low energy first and second laser beams having a level of energy of between 1-10 joules.Type: GrantFiled: August 31, 2001Date of Patent: May 27, 2003Assignee: General Electric CompanyInventors: Ui Won Suh, Seetharamaiah Mannava, Todd Jay Rockstroh
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Patent number: 6570125Abstract: A method to laser shock peen articles such as a gas turbine engine rotor blade with first and second oblique laser beams to form pairs of longitudinally spaced apart first and second laser shock peened elliptical spots that are on opposite sides of the article or blade and transversely offset from each other. The oblique laser beams are fired at a portion of the leading or trailing edges of the blade at first and second oblique angles with respect to opposite surfaces of the edge. Another method laser shock peens the leading and trailing edges of gas turbine engine integrally bladed rotors and disks that are blocked by other rows of blades by firing the laser beams at compound angles such that the beams are aimed at the first and second oblique angles with respect to the surfaces of the edge and at a third oblique angle with respect to a rotor axis.Type: GrantFiled: August 31, 2001Date of Patent: May 27, 2003Assignee: General Electric CompanyInventors: Ui Won Suh, Seetharamaiah Mannava, Todd Jay Rockstroh
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Publication number: 20030062349Abstract: A method for quality control monitoring of laser shock peening a surface of a production workpiece during which laser beam pulses form a plurality of corresponding plasmas. An acoustic signal of each laser beam pulse during a period of time during a duration of each corresponding one of the plasmas is monitored and an acoustic energy parameter value for each of the acoustic signals for each of the corresponding laser pulses is calculated. A statistical function value of the workpiece based on the acoustic energy parameter values is calculated and compared to a pass or fail criteria for accepting or rejecting the workpiece. The criteria may be based on a pre-determined correlation of test piece statistical function data such as high cycle fatigue failure data of test pieces. The statistical function value may be an average of the acoustic energy parameter values of the laser beam pulses.Type: ApplicationFiled: October 3, 2001Publication date: April 3, 2003Inventors: Ui Won Suh, James Douglas Risbeck