Patents by Inventor Ulf Heim

Ulf Heim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reflectometer arrangement and method for determining the reflectance of selected measurement locations of measurement objects reflecting in a spectrally dependent manner
    Patent number: 6856395
    Abstract: In a reflectometer arrangement and a method for determining the reflectance of selected measurement locations on measurement objects reflecting in a spectrally dependent manner, the object of the invention is to reduce the time for measuring a measurement object with a robust and simple measurement structure to such an extent that compact radiation sources with low output compared to a synchrotron can be used at the site of production or of use of the measurement object to characterize the object characteristics in a manner suited to series production. A measurement beam bundle proceeding from a polychromatically emitting radiation source is directed onto the measurement location of the measurement object sequentially in modified manner by impressing spectral reference reflection characteristics and the radiation reflected from every measurement location is detected integrally.
    Type: Grant
    Filed: April 11, 2002
    Date of Patent: February 15, 2005
    Assignees: AIXUV GmbH, JENOPTIK Mikrotechnik GmbH, Schott Glas
    Inventors: Rainer Lebert, Ulf Heim, Lutz Aschke, Larissa Juschkin
  • Reflectometer arrangement and method for determining the reflectance of selected measurement locations of measurement objects reflecting in a spectrally dependent manner
    Publication number: 20020175690
    Abstract: In a reflectometer arrangement and a method for determining the reflectance of selected measurement locations on measurement objects reflecting in a spectrally dependent manner, the object of the invention is to reduce the time for measuring a measurement object with a robust and simple measurement structure to such an extent that compact radiation sources with low output compared to a synchrotron can be used at the site of production or of use of the measurement object to characterize the object characteristics in a manner suited to series production. A measurement beam bundle proceeding from a polychromatically emitting radiation source is directed onto the measurement location of the measurement object sequentially in modified manner by impressing spectral reference reflection characteristics and the radiation reflected from every measurement location is detected integrally.
    Type: Application
    Filed: April 11, 2002
    Publication date: November 28, 2002
    Inventors: Rainer Lebert, Ulf Heim, Lutz Aschke, Larissa Juschkin
  • Device for the deflection of light beams
    Patent number: 5719694
    Abstract: A device for deflecting light beams, in particular laser beams, has mirror surfaces which are arranged at a drivable rotating body. The rotating body is formed of monocrystalline material and the mirror surfaces are formed by the crystal planes and are arranged symmetrically with respect to rotation.
    Type: Grant
    Filed: June 30, 1995
    Date of Patent: February 17, 1998
    Assignees: LDT GmbH & Co., Laser-Display-Technologie KG
    Inventors: Norbert Schwesinger, Ulf Heim, Helmut Wurmus