Abstract: A testing device for electrically testing an electrical test specimen, in particular a wafer, the testing device having a test head in which at least one testing contact is mounted for electrically contacting a test specimen. At least one outlet opening for discharging a gas, in particular a protective gas, into a contact region, is provided in a wall of the test head.

Abstract: The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.

Abstract: The invention relates to a contacting device for contacting an electrical test piece to be tested, in particular a test piece provided with tin-plated contacts, comprising at least two guide elements having openings through which contact elements pass essentially axially and which project from the test piece, on a side of the associated guide element facing the test piece, for contacting the test piece. The invention is characterized in that the axial distance between the guide elements or the axial position of the guide element facing the test piece may be adjusted to fit the projecting length.

Abstract: A test head for making contact with test points of an electric component under test and with contact points on a board, for example. A plurality of spring elastic, elongated electric contact elements have opposite ends which respectively contact a test point at one end and a contact point at the other end. A plurality of at least two and preferably three guide panels are located in the space between the test points and the contact points. A respective, first, second and third opening in the first, second and third panels for each of the contact elements for each of the contact elements, with two adjacent openings for each of the contact elements being laterally offset and misaligned so that the contact element passing through them is held in a friction locked fashion.

Abstract: A test head for making contact with test points arranged close to one another of an electric component. The test head having a plurality of contact elements which can be connected to a connecting element of a test device. The contact elements are in respective feed-through openings through two or three overlying guide panels. The contact elements are axially guidable in the feed-through openings in the panel. Various ways of securing the contact elements against falling out of the test head are provided, including friction locking of the contact elements in one panel, using a securing layer at one panel, laterally offsetting one panel with respect to the others, or by different diameters along the length of the contact element, e.g. by insulation selectively applied along the length. The connecting element and the device for making contact are detachably connected.