Patents by Inventor Ulrich Geissmann

Ulrich Geissmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
    Patent number: 7449686
    Abstract: The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.
    Type: Grant
    Filed: June 7, 2005
    Date of Patent: November 11, 2008
    Assignee: Bruker Daltonics, Inc.
    Inventors: Yang Wang, Melvin A. Park, Ulrich Geissmann
  • APPARATUS AND METHOD FOR ANALYZING SAMPLES IN A DUAL ION TRAP MASS SPECTROMETER
    Publication number: 20050139760
    Abstract: The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.
    Type: Application
    Filed: September 26, 2003
    Publication date: June 30, 2005
    Inventors: Yang Wang, Melvin Park, Ulrich Geissmann
  • Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
    Patent number: 6906324
    Abstract: The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: June 14, 2005
    Assignee: Bruker Daltonics Inc.
    Inventors: Yang Wang, Melvin A. Park, Ulrich Geissmann
  • Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
    Patent number: 6627883
    Abstract: The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.
    Type: Grant
    Filed: March 2, 2001
    Date of Patent: September 30, 2003
    Assignee: Bruker Daltonics Inc.
    Inventors: Yang Wang, Melvin A. Park, Ulrich Geissmann
  • Apparatus and method for analyzing samples in a dual ion trap mass spectrometer
    Publication number: 20020121594
    Abstract: The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.
    Type: Application
    Filed: March 2, 2001
    Publication date: September 5, 2002
    Inventors: Yang Wang, Melvin A. Park, Ulrich Geissmann