Abstract: A method is described for parametrizing an integrated circuit by applying a digital start command signal followed by a parametrization data signal to the supply voltage terminal and/or the output terminal of the integrated circuit. During the parametrization process, the voltage level applied to the supply voltage terminal and/or the output terminal is kept above the normal operating voltage level and detected by a detector device provided in integrated circuit. The integrated circuit includes the supply voltage terminal, a reference potential terminal, and the output terminal, as well as an internal memory which is preferably non-volatile. The adjustment specification for parametrizing the integrated circuit is stored in the memory and activated by the parametrization data signal.

Abstract: A method is described for parametrizing an integrated circuit by applying a digital start command signal followed by a parametrization data signal to the supply voltage terminal and/or the output terminal of the integrated circuit. During the parametrization process, the voltage level applied to the supply voltage terminal and/or the output terminal is kept above the normal operating voltage level and detected by a detector device provided in integrated circuit. The integrated circuit includes the supply voltage terminal, a reference potential terminal, and the output terminal, as well as an internal memory which is preferably non-volatile. The adjustment specification for parametrizing the integrated circuit is stored in the memory and activated by the parametrization data signal.

Abstract: An integrated circuit (IC) includes a first lead, a second lead and a sensor element that provides a sensed signal. The IC also includes a test signal generator that provides a test signal, a signal processing unit, and a switching device that selectively applies the sensed signal or the test signal to the signal processing unit in response to a command signal, wherein the signal processing unit provides processed data. In response to a test command input signal, the IC generates the command signal, wherein when the test input signal is active the command signal is set to command the switching device to input the test signal to the signal processing unit. A check sum calculator receives the processed data and provides a signal indicative of a check sum value on the second lead when the command signal is set to command the switching device to input the test signal to the signal processing unit.

Abstract: A method and a sensing device transmit speed information and additional information over a transmission channel. For this purpose, the transmission clock cycle is selected to reflect the speed and is detected by the sensing device. The additional information is transmitted as a modulation of the transmission clock cycle.