Abstract: A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.

Abstract: A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.

Abstract: A dual mode amplifier having single ended and differential ended modes of operation using only one set of output pads or terminals. The dual mode amplifier has two differential amplifiers, connected by coupling circuitry, each differential amplifier receiving a pair of differential input signals and having one output terminal. By activating and deactivating the coupling circuitry, the differential amplifiers can operate in two modes using the one set of output terminals. In the singled ended mode, the differential amplifiers operate independently, each converting the differential input signals to a singled ended output signal at their respective output terminals. In the differential mode, the differential amplifiers operate together to provide a pair of differential output signals at the output terminals based upon the pair of input signals.

Abstract: A dual mode amplifier having single ended and differential ended modes of operation using only one set of output pads or terminals. The dual mode amplifier has two differential amplifiers, connected by coupling circuitry, each differential amplifier receiving a pair of differential input signals and having one output terminal. By activating and deactivating the coupling circuitry, the differential amplifiers can operate in two modes using the one set of output terminals. In the singled ended mode, the differential amplifiers operate independently, each converting the differential input signals to a singled ended output signal at their respective output terminals. In the differential mode, the differential amplifiers operate together to provide a pair of differential output signals at the output terminals based upon the pair of input signals.

Abstract: A dual mode amplifier having single ended and differential ended modes of operation using only one set of output pads or terminals. The dual mode amplifier has two differential amplifiers, connected by coupling circuitry, each differential amplifier receiving a pair of differential input signals and having one output terminal. By activating and deactivating the coupling circuitry, the differential amplifiers can operate in two modes using the one set of output terminals. In the singled ended mode, the differential amplifiers operate independently, each converting the differential input signals to a singled ended output signal at their respective output terminals. In the differential mode, the differential amplifiers operate together to provide a pair of differential output signals at the output terminals based upon the pair of input signals.

Abstract: A circuit for applying a testing data to a DUT for testing the DUT comprises a buffer memory for receiving and buffering a redundancy-free information as information which is substantially free of redundancy but might also comprise some redundant information to a certain extent, a redundancy memory for storing a redundancy information as information comprising a certain amount of redundancy, and a processing unit for generating the testing data by processing the redundancy-free information in association with the redundancy information. Further, includes a method for applying a testing data to the DUT for testing the DUT includes the steps of receiving and buffering the redundancy-free information, fetching in accordance with the received redundancy-free information the redundancy information, and generating the testing data by processing the redundancy-free information in association with the redundancy information.

Abstract: Described is a circuit for receiving a differential input signal at two substantially symmetrically built up current paths and for providing an output signal therefrom. At least one current path comprises means for adjusting the timing information of the input signal to the timing information of the output signal. The adjustment can be accomplished by modifying a voltage level in the respective current path until the timing information of the output signals at least substantially represents the timing information of the input signal, e.g. by modifying an impedance or a current in the respective current path. The adjusting of the timing information is executed by applying a defined input signal with a known timing information, comparing the timing information of the resulting output signal with the timing information of the input signal, and modifying at least one voltage level in at least one of the current paths until the timing information of the output and input signals at least substantially match.

Abstract: A formatter circuit for an integrated circuit tester comprises at least one edge-triggered toggle flip-flop, which may be constituted of an EXOR gate and a D flip-flop. This allows to build an event-driven formatter with broad flexibility and "change timing" capability. The basic toggle flip-flops may be cascaded by further EXOR gates, in order to perform more complex functions and to combine several data input signals or clock signals.