Abstract: An electro-optical analyzing system is provided with a wavelength tunable laser so that a DUT may be laser illuminated at different wavelengths. The signal qualities are determined corresponding to a reflection from the DUT of illumination of the laser at multiple wavelengths.

Abstract: An integrated circuit device includes an active silicon layer, and at least one passive metal layer placed in an input region and an output region of the device. The at least one passive metal layer has a surface area and thickness for at least one of the input region or the output region to provide a phase shift of an optical laser, the phase shift corresponding to an optimized visibility of the optical laser during an optic failure analysis of the device.

Abstract: An apparatus includes an electrically insulating thermally conductive carrier for supporting a device under test (DUT), one or more thermo-electric devices arranged with the carrier, and one or more conductive vias in the carrier to make electrical connection to the DUT for coupling to an external test apparatus. A method of testing a device under test (DUT) includes supporting the DUT on an electrically insulating thermally conductive carrier, arranging one or more thermo-electric devices coupled to the carrier to control the temperature of the DUT, connecting the DUT electrically to an external test apparatus through one or more conductive vias in the carrier, connecting the one or more thermo-electric devices to the external test apparatus, and characterizing with the external apparatus the DUT on the basis of the temperature of the DUT.