Patents by Inventor Umesh Pratap Singh

Umesh Pratap Singh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus to inject errors in a memory block and validate diagnostic actions for memory built-in-self-test (MBIST) failures
    Patent number: 12164401
    Abstract: A memory built in self test (MBIST) controller of an MBIST circuit outputs first data. One or more errors is injected in the first data to produce second data. The second data is stored in the memory block. The memory block outputs the second data stored in the memory block. The MBIST controller receives the second data and detects an error in the second data based on a comparison with the first data, the error indicative of a failure of the MBIST. The MBIST controller provides an indication of failure of the MBIST to a processing core external to the MBIST circuit which performs diagnostic action in response to receiving the indication of failure of the MBIST. The processing core validates implementation of the diagnostic action.
    Type: Grant
    Filed: May 17, 2023
    Date of Patent: December 10, 2024
    Assignee: NXP B.V.
    Inventors: Umesh Pratap Singh, Ajay Sharma, Ruchi Bora, Ashish Goel
  • METHOD AND APPARATUS TO INJECT ERRORS IN A MEMORY BLOCK AND VALIDATE DIAGNOSTIC ACTIONS FOR MEMORY BUILT-IN-SELF-TEST (MBIST) FAILURES
    Publication number: 20240320112
    Abstract: A memory built in self test (MBIST) controller of an MBIST circuit outputs first data. One or more errors is injected in the first data to produce second data. The second data is stored in the memory block. The memory block outputs the second data stored in the memory block. The MBIST controller receives the second data and detects an error in the second data based on a comparison with the first data, the error indicative of a failure of the MBIST. The MBIST controller provides an indication of failure of the MBIST to a processing core external to the MBIST circuit which performs diagnostic action in response to receiving the indication of failure of the MBIST. The processing core validates implementation of the diagnostic action.
    Type: Application
    Filed: May 17, 2023
    Publication date: September 26, 2024
    Inventors: Umesh Pratap Singh, Ajay Sharma, Ruchi Bora, Ashish Goel