Abstract: A system for testing memory includes logic that is configured to perform various normal memory operations (e.g., erase, read and write operations) on a memory device and to determine operational parameters associated with the memory operations. As an example, the amount of time to perform one or more memory operations may be measured, a number of errors resulting from the memory operations may be determined, or a number of memory cells storing noisy bits may be identified. One or more of the operational parameters may then be analyzed to determine whether they are in a range expected for counterfeit or defective memory. If so, the logic determines that the memory under test is counterfeit or defective and provides a notification about such determination.