Abstract: A display panel and an electronic device including the same are disclosed. A display panel includes metal layers, a first insulating layer covering the metal layers, a first reflective layer on the first insulating layer of a first sub-pixel, a second insulating layer covering the first reflective layer, a second reflective layer on the second insulating layer of a second sub-pixel, a third insulating layer covering the second reflective layer, a third reflective layer on the third insulating layer of a third sub-pixel, and first electrodes on the third insulating layer of each of the first to third sub-pixels. A plurality of holes penetrating the first to third insulating layers of each of the first to third sub-pixels is formed, and the metal layer of each of the first to third sub-pixels is coupled to the first electrode of each of the first to third sub-pixels through each hole.

Abstract: An integrated circuit chip test system comprises a reference chip adapted to generate original test data, and a test target chip adapted to receive and process the original test data to produce processed test data. The test target chip returns the processed test data to the reference chip, and the reference chip detects the presence of functional defects in the test target chip by comparing the test data with the processed test data.