Abstract: Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.

Abstract: Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.

Abstract: The present invention discloses a contactor of the device for testing a semiconductor device comprising a fixed block receiving a test tray having a plurality of a semiconductor device, a base plate having a cylinder on one side of the base plate and installed in one side of the fixed block, a push plate moving forward and backward by the cylinder and installed between the base plate and the fixed block, a plurality of an air nozzle to be contacted to the test tray by a forward and backward movement of the push plate having the cylinder, and installed in the push plate and protruded to the test tray, and a providing means of blending air to guide and provide the blending air for the air nozzle.

Abstract: The present invention discloses a contactor of the device for testing a semiconductor device comprising a fixed block receiving a test tray having a plurality of a semiconductor device, a base plate having a cylinder on one side of the base plate and installed in one side of the fixed block, a push plate moving forward and backward by the cylinder and installed between the base plate and the fixed block, a plurality of an air nozzle to be contacted to the test tray by a forward and backward movement of the push plate having the cylinder, and installed in the push plate and protruded to the test tray, and a providing means of blending air to guide and provide the blending air for the air nozzle.