Abstract: The present disclosure generally relates to data transfer device for receiving data from a host device and method therefor. The device comprise a plurality of input ports configured to receive input data comprising of a plurality of bytes, an output port configured to provide an output data byte and a plurality of buffer units, each buffer unit coupled to an input port of the plurality of input ports. Each of the plurality of buffer units receives a portion of the input data, wherein an enable bit is associated with the portion of data and each of the buffer devices provides the received portion of data as an output, if the enable bit indicates that the portion of data is not a garbage data.

Abstract: The present disclosure generally relates to data transfer device for receiving data from a host device and method therefor. The device comprise a plurality of input ports configured to receive input data comprising of a plurality of bytes, an output port configured to provide an output data byte and a plurality of buffer units, each buffer unit coupled to an input port of the plurality of input ports. Each of the plurality of buffer units receives a portion of the input data, wherein an enable bit is associated with the portion of data and each of the buffer devices provides the received portion of data as an output, if the enable bit indicates that the portion of data is not a garbage data.

Abstract: A method of reinforcement learning in a processing element, the method including receiving, by a receiving module, one reward. Further, a computing module computes a Q-value for a first dimension at time tn, based on the reward. The Q-value is locally stored. A time-division multiplexing module replaces the computed Q-value for the first dimension with at least one Q-value computed for a second dimension at time tn+1. The second dimension is different than the first dimension.

Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with the storage circuit (110) and with the functional circuit modules (IP.i. The test controller (140, 150) is operable to dynamically schedule and trigger the tests in those sets, which promotes concurrent execution of tests in the functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.

Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.

Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.

Abstract: A testable integrated circuit chip (80, 100) includes a functional circuit (80) having modules (IP.i), a storage circuit (110) operable to hold a table representing sets of compatible tests that are compatible for concurrence, and an on-chip test controller (140, 150) coupled with said storage circuit (110) and with said functional circuit modules (IP.i), said test controller (140, 150) operable to dynamically schedule and trigger the tests in those sets, whereby promoting concurrent execution of tests in said functional circuit modules (IP.i). Other circuits, wireless chips, systems, and processes of operation and processes of manufacture are disclosed.