Patents by Inventor Urs Matter

Urs Matter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9448393
    Abstract: This invention concerns scanning probe microscopes and related instruments (“SPMs”) when used to investigate or measure large samples whose size is a multiple of the typical operational scanning area of an SPM, say 150 ?m×150 ?m at most. To avoid frequent readjustments or other time-consuming human interaction and errors when focusing the SPM, a multi-step, automated method for the SPM-scanning of large samples is disclosed, comprising a “coarse”, i.e. low resolution, non-SPM scanning or mapping step adapted to scan a large sample and providing an integral map of the sample, followed by a preferably mathematical evaluation step identifying areas of interest of the sample, which areas are then subjected to a focused “fine” raster scanning step by the SPM with high resolution. The associated apparatus provides the means to execute this novel three-step process.
    Type: Grant
    Filed: February 24, 2015
    Date of Patent: September 20, 2016
    Assignee: NUOMEDIS AG
    Inventors: Robert Sum, Lukas Emanuel Howald, Urs Matter
  • Publication number: 20150241468
    Abstract: This invention concerns scanning probe microscopes and related instruments (“SPMs”) when used to investigate or measure large samples whose size is a multiple of the typical operational scanning area of an SPM, say 150 ?m×150 ?m at most. To avoid frequent readjustments or other time-consuming human interaction and errors when focusing the SPM, a multi-step, automated method for the SPM-scanning of large samples is disclosed, comprising a “coarse”, i.e. low resolution, non-SPM scanning or mapping step adapted to scan a large sample and providing an integral map of the sample, followed by a preferably mathematical evaluation step identifying areas of interest of the sample, which areas are then subjected to a focused “fine” raster scanning step by the SPM with high resolution. The associated apparatus provides the means to execute this novel three-step process.
    Type: Application
    Filed: February 24, 2015
    Publication date: August 27, 2015
    Inventors: Robert SUM, Lukas Emanuel HOWALD, Urs MATTER
  • Publication number: 20070188163
    Abstract: A sensor device is suggested, comprising a sensor module with a housing, with at least one sensor element which is arranged in the housing, at least one active sensor face and a sensor module connection device and a holding module for holding the sensor module, a holding module connection device which is adapted to the sensor module connection device, wherein the sensor module can be fixed to the holding module via the sensor module connection device and the holding module connection device and an electrical connection can be made available between the sensor module and the holding module, and wherein the holding module is provided for the fixing to an application or is part of an application, the supply of energy to the sensor module is brought about via the holding module and the coupling out of signals is brought about via the holding module.
    Type: Application
    Filed: January 22, 2007
    Publication date: August 16, 2007
    Applicant: BALLUFF GmbH
    Inventors: Manfred Jagiella, Winfried Kunzweiler, Urs Matter, Simon Mahler
  • Publication number: 20060138316
    Abstract: Time-of-flight mass spectrometer (1), comprising an extractor module (3) for accelerating ionized substances by means of an electric field and for focusing the ionized substance onto a focusing axis (6) by means of at least one ion lens (32), a deflector (4) for deflecting the ionized substances, a drift path (7) as well as a detector (5) for detecting the ionized substance, the extractor module (3) being displaceably disposed relative to the detector (5), and the focusing axis being centered, in a first position, on the detector surface (51), while the focusing axis (6), in a second position, is positioned outside the detector surface (51). The invention allows in particular the spectra of neutral and charged particles to be measured independently from one another.
    Type: Application
    Filed: January 28, 2003
    Publication date: June 29, 2006
    Inventors: Robert Seydoux, Urs Matter, Lothar Schultheis