Patents by Inventor Urs Rothacher

Urs Rothacher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150247914
    Abstract: An improved method for avoiding mid-air collision in aviation is disclosed. The method relies on a calibration of radio signal intensities I with radio signal encoded position information L. In other words, after a first reception of a radio signal S advantageously comprising remote aircraft position information L, the radio signal intensity I is measured and a correction factor C is derived. During a next encounter of the radio signal S, a second distance estimation d can be derived using the signal intensity I and the correction factor C. Preferably, relative positioning data is acquired together with the correction factor C and a plurality of correction factors for different relative positions is combined in an at least partly continuous correction function.
    Type: Application
    Filed: October 5, 2012
    Publication date: September 3, 2015
    Inventors: Urs Rothacher, Urban Mader
  • Patent number: 7900496
    Abstract: A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing the wafer to a calibration fluid containing a known amount of the substance to be measured. Hence, rather than first cutting the wafer, the sensors are calibrated at an early stage. For this purpose, they are placed on a chuck below a lid. The calibration fluid with known parameters is introduced between the wafer and the lid. This allows to test and calibrate a large number of sensors quickly.
    Type: Grant
    Filed: September 7, 2007
    Date of Patent: March 8, 2011
    Assignee: Sensirion AG
    Inventors: Felix Mayer, Mathias Deschler, Urs Rothacher, René Hummel
  • Patent number: 7770433
    Abstract: The humidity detector comprises a housing adapted to hold a humidity sensor towards the windscreen of a vehicle or any other type of window. A flexible printed circuit board is arranged between the humidity sensor and the windscreen and provides a connection between the humidity sensor and further circuitry of the detector. The humidity sensor is located under a cap, which is engaged by a glider member. A spring pushes the glider member towards the windscreen.
    Type: Grant
    Filed: May 29, 2007
    Date of Patent: August 10, 2010
    Assignee: Sensirion AG
    Inventors: Urs Rothacher, Felix Mayer, Moritz Lechner, Vincent Hess
  • Publication number: 20080105035
    Abstract: The device comprises a housing with two humidity sensors. A first opening of the housing is placed onto or into the soil, while a second opening is located outside the soil in communication with the environment. A chamber extends in the housing between the first and the second opening. This chamber allows humidity to diffuse between the openings. The humidity sensors are located to measure the humidity at two spaced apart locations within the chamber. The difference of humidity measured at these two locations is a measure of soil moisture content.
    Type: Application
    Filed: October 10, 2007
    Publication date: May 8, 2008
    Inventors: Urs Rothacher, Felix Mayer
  • Publication number: 20080016945
    Abstract: The humidity detector comprises a housing adapted to hold a humidity sensor towards the windscreen of a vehicle or any other type of window. A flexible printed circuit board is arranged between the humidity sensor and the windscreen and provides a connection between the humidity sensor and further circuitry of the detector. The humidity sensor is located under a cap, which is engaged by a glider member. A spring pushes the glider member towards the windscreen.
    Type: Application
    Filed: May 29, 2007
    Publication date: January 24, 2008
    Inventors: Urs Rothacher, Felix Mayer, Moritz Lechner, Vincent Hess
  • Publication number: 20080006076
    Abstract: A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing the wafer to a calibration fluid containing a known amount of the substance to be measured. Hence, rather than first cutting the wafer, the sensors are calibrated at an early stage. For this purpose, they are placed on a chuck below a lid. The calibration fluid with known parameters is introduced between the wafer and the lid. This allows to test and calibrate a large number of sensors quickly.
    Type: Application
    Filed: September 7, 2007
    Publication date: January 10, 2008
    Inventors: Felix Mayer, Mathias Deschler, Urs Rothacher, Rene Hummel
  • Patent number: 7281405
    Abstract: A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing the wafer to a calibration fluid containing a known amount of the substance to be measured. Hence, rather than first cutting the wafer, the sensors are calibrated at an early stage. For this purpose, they are placed on a chuck below a lid. The calibration fluid with known parameters is introduced between the wafer and the lid. This allows to test and calibrate a large number of sensors quickly.
    Type: Grant
    Filed: August 1, 2005
    Date of Patent: October 16, 2007
    Assignee: Sensirion AG
    Inventors: Felix Mayer, Mathias Deschler, Urs Rothacher, René Hummel
  • Publication number: 20060053862
    Abstract: A method and device are disclosed for calibrating sensors, which sensors are arranged on semiconductor chips and are e.g. to be used for detecting a substance in a fluid. The sensors are calibrated while they are still assembled on a semiconductor wafer by exposing the wafer to a calibration fluid containing a known amount of the substance to be measured. Hence, rather than first cutting the wafer, the sensors are calibrated at an early stage. For this purpose, they are placed on a chuck below a lid. The calibration fluid with known parameters is introduced between the wafer and the lid. This allows to test and calibrate a large number of sensors quickly.
    Type: Application
    Filed: August 1, 2005
    Publication date: March 16, 2006
    Inventors: Felix Mayer, Mathias Deschler, Urs Rothacher, Rene Hummel