Abstract: There is provided a method, a non-transitory computer readable medium, and a system for measuring a pattern. The method can include (a) obtaining an electron image of an area of a sample, the area comprises the pattern, the electron image comprises multiple lines; each line comprises information obtained by moving an electron beam over a scan line; (b) generating a converted image by applying a noise reduction kernel on the electron image, the noise reduction kernel has a width that represents a number of consecutive lines of the electron image; the width is determined based on relationships between analysis results obtained when using noise reduction kernels of different widths; and (c) analyzing the converted image to provide a pattern measurement.

Abstract: A system includes one or more client instances of a client hosted by a platform, in which the one or more client instances include an agent portal. The agent portal may receive a request from a customer related to a customer issue, determine a context for the customer issue based on one or more attributes, and determine a subset of actions as recommended actions based on factors to resolve the customer issue. The factors may include the context, historical data associated with the customer, and/or a client interest associated with the client. Moreover, the agent portal may rank the recommended actions as ranked recommended actions, display the ranked recommended actions for selection by the agent, and provide a guidance corresponding to a selected recommended action.

Abstract: There is provided a method, a non-transitory computer readable medium, and a system for measuring a pattern. The method can include (a) obtaining an electron image of an area of a sample, the area comprises the pattern, the electron image comprises multiple lines; each line comprises information obtained by moving an electron beam over a scan line; (b) generating a converted image by applying a noise reduction kernel on the electron image, the noise reduction kernel has a width that represents a number of consecutive lines of the electron image; the width is determined based on relationships between analysis results obtained when using noise reduction kernels of different widths; and (c) analyzing the converted image to provide a pattern measurement.