Patents by Inventor Utpal Patel

Utpal Patel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatic framework to create QA test pass
    Patent number: 11494289
    Abstract: In an aspect of the disclosure, a method, a computer-readable medium, and a device are provided. The device determines one or more feature components of firmware of a BMC to be tested. The device also determines a respective QA category from a plurality of QA categories for each of the one or more feature components. Each of the plurality of QA categories is associated with a set of feature components and a set of the test cases. The device further determines respective at least one test case for each of the one or more feature components based on the respective QA category of the each feature component. The test case specifies hardware and a procedure to be used to test the each feature component.
    Type: Grant
    Filed: January 28, 2019
    Date of Patent: November 8, 2022
    Assignee: AMERICAN MEGATRENDS INTERNATIONAL, LLC
    Inventors: Anurag Bhatia, Samvinesh Christopher, Winston Thangapandian, Utpal Patel
  • AUTOMATIC FRAMEWORK TO CREATE QA TEST PASS
    Publication number: 20200242014
    Abstract: In an aspect of the disclosure, a method, a computer-readable medium, and a device are provided. The device determines one or more feature components of firmware of a BMC to be tested. The device also determines a respective QA category from a plurality of QA categories for each of the one or more feature components. Each of the plurality of QA categories is associated with a set of feature components and a set of the test cases. The device further determines respective at least one test case for each of the one or more feature components based on the respective QA category of the each feature component. The test case specifies hardware and a procedure to be used to test the each feature component.
    Type: Application
    Filed: January 28, 2019
    Publication date: July 30, 2020
    Inventors: Anurag Bhatia, Samvinesh Christopher, Winston Thangapandian, Utpal Patel