Abstract: The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P1) of the evaluated time delays (TD); obtaining a second probability distribution (P2) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P3) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P3) is on a good side (GS) of the test limit (TL2).

Abstract: A method and device for detecting an error rate of a receiver of data transmitted to a device that is to be checked is provided. A test device generates a data block having a first length and a test signal generated based on the data block is sent. The device to be checked receives and evaluates the test signal. Another data block having a different length is generated based on the evaluated test signal to obtain another data rate. The other data block is sent as a response signal in a different transmission direction, and is received and evaluated by the transmitter/receiver device of the test device. An evaluation unit compares the contents of both data blocks to detect the error rate, wherein the content of the shorter data block is compared with the content of a corresponding segment of the longer data block to determine the error rate.

Abstract: A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability F for the entire test. Ns bits of the output of the device are measured, thereby ne erroneous bits of these ns bits are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision probability D, which is smaller than the probability F for the entire test. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=BERlimit ns. If NElimit the test is stopped. Sequential sampling with two one-tailed parametric hypothesis test for the poisson distribution.

Abstract: The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method comprises the steps of: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modelling a first probability distribution (P1) as a function of the elapsed time from the first occurrence of the first event to the first occurrence of the second event; obtaining a second probability distribution (P2) as a function of the elapsed time from the first occurrence of the first event to the N-th occurrence of the second event; performing a statistical transformation in order to obtain a third probability distribution (P3) as a function of the N-th occurence of the second event; deciding to pass the device under test according to the comparison of P3 with the test limite.