Abstract: An electrical switch includes a coil assembly, an armature rotatable about an axis of rotation and driven by the coil assembly, and a contact assembly having a contact spring directly connected to the armature. The contact spring is a spring pack including a plurality of springs. At least one of the springs of the spring pack is formed of a first material and at least another one of the springs of the spring pack is formed of a second material different from the first material.

Abstract: An electrical switch includes a coil assembly, an armature rotatable about an axis of rotation and driven by the coil assembly, and a contact assembly having a contact spring directly connected to the armature. The contact spring is a spring pack including a plurality of springs. At least one of the springs of the spring pack is formed of a first material and at least another one of the springs of the spring pack is formed of a second material different from the first material.

Abstract: An electrical switch comprises a coil assembly, an armature, and a contact assembly. The armature is rotatable about an axis of rotation and is driven by the coil assembly. The contact assembly has a contact spring directly connected to the armature.

Abstract: An arrangement for an electric switching device is disclosed. The arrangement for an electric switching device comprises a switching unit having a first switching position and a second switching position, a restoring element exerting a restoring force on the switching unit in the second switching position, and a return spring fastened to the switching unit and exerting a counterforce on the switching unit. The restoring force is directed toward the first switching position, while the counterforce acts opposite to the restoring force.

Abstract: An arrangement for an electrical switching device is disclosed. The arrangement for an electrical switching device comprises a contact spring and a component attached to the contact spring. The component has an edge running in an inclined manner with respect to a longitudinal direction of the contact spring. The component also has at least two switching state positions and a transition phase between the switching state positions, and abuts the contact spring along the edge in the transition phase.

Abstract: An electrical switch comprises a coil assembly, an armature, and a contact assembly. The armature is rotatable about an axis of rotation and is driven by the coil assembly. The contact assembly has a contact spring directly connected to the armature.

Abstract: A short-circuit shutdown switch is disclosed having a load current path and a cutting plunger. The load current path has a separating member with a first predetermined cutting zone, a second predetermined cutting zone, and a central section positioned between the first predetermined cutting zone and the second predetermined cutting zone. The cutting plunger is positioned to cut the first predetermined cutting zone and the second predetermined cutting zone.

Abstract: An arrangement for an electric switching device is disclosed. The arrangement for an electric switching device comprises a switching unit having a first switching position and a second switching position, a restoring element exerting a restoring force on the switching unit in the second switching position, and a return spring fastened to the switching unit and exerting a counterforce on the switching unit. The restoring force is directed toward the first switching position, while the counterforce acts opposite to the restoring force.

Abstract: An arrangement for an electrical switching device is disclosed. The arrangement for an electrical switching device comprises a contact spring and a component attached to the contact spring. The component has an edge running in an inclined manner with respect to a longitudinal direction of the contact spring. The component also has at least two switching state positions and a transition phase between the switching state positions, and abuts the contact spring along the edge in the transition phase.

Abstract: A short-circuit shutdown switch is disclosed having a load current path and a cutting plunger. The load current path has a separating member with a first predetermined cutting zone, a second predetermined cutting zone, and a central section positioned between the first predetermined cutting zone and the second predetermined cutting zone. The cutting plunger is positioned to cut the first predetermined cutting zone and the second predetermined cutting zone.

Abstract: The invention relates to a magazine for a device of a measuring system for determining an analyte concentration in a body fluid sample, wherein the magazine contains consumable analytical elements in a plurality of chambers. According to the invention, a data carrier, on which information is stored, is fastened to the magazine, the information indicating which magazine chambers are not intended for removal of a consumable element due to manufacturing defects. The invention further relates to a device, the control unit of which suppresses access by the removal unit to predefined magazine chambers, to a measuring system comprising such a device and a magazine, and to a method for controlling the removal unit of the device.

Abstract: Embodiments of the invention relate to correcting errors in scanning electron measurements during measuring structural dimensions of an integrated circuit for optical proximity correction by extracting feature edges of a test pattern within an image, calculating at least one scaling error of the image by comparing the extracted feature edges of assist structures with a layout pattern, modifying feature edges of test structures within the test pattern by incorporating the at least one scaling error so as to at least partially compensate the scaling errors, and verifying a model for optical proximity corrections and/or model input data by using the modified feature edges of the test structures.

Abstract: Embodiments of the invention relate to correcting errors in scanning electron measurements during measuring structural dimensions of an integrated circuit for optical proximity correction by extracting feature edges of a test pattern within an image, calculating at least one scaling error of the image by comparing the extracted feature edges of assist structures with a layout pattern, modifying feature edges of test structures within the test pattern by incorporating the at least one scaling error so as to at least partially compensate the scaling errors, and verifying a model for optical proximity corrections and/or model input data by using the modified feature edges of the test structures.

Abstract: The invention relates to a reusable piercing aid, containing a lancet, an energy store for transmission of energy stored in the energy store to the lancet in order to carry out a piercing movement, a charging device for charging the energy store, and a control unit, wherein the control unit is designed in such a way that, following the piercing movement, it controls the charging device such that, following the piercing movement, the energy store is automatically charged with energy for the next piercing movement of the lancet.

Abstract: A method and apparatus for setting appliance-specific evaluation parameters in an instrument is disclosed. In one embodiment, a structure is measured using a reference measurement apparatus or a measurement apparatus, and the recorded measurement data is transmitted to the respective other of the two appliances. The measurement data is contained in the data memory of both the instrument and of the reference instrument. The measurement data items are then evaluated by the evaluation device and the reference evaluation device by determining a determined structure size and a reference structure size. The determined structure size is compared with the reference structure size, and the evaluation parameters of the evaluation device are varied until the difference between the determined structure size and the reference structure size is less than a predetermined value.

Abstract: The present invention provides a system for analyzing a sample liquid comprising a test tape having a plurality of test elements, a tape transport device which successively transports the test elements to a sample application site while advancing the tape, and a measuring device which scans the test elements loaded with sample liquid at a measuring site. The measuring site is located at a distance from the sample application site in the direction of tape movement. The tape transport is interrupted in order to exactly position a wetted area of the test elements carrying a sample liquid at the measuring site by means of a positioning device that responds to the presence of sample liquid on the test element.

Abstract: A substrate having at least four reference patterns at respective nominal positions on a surface is provided. Using a scanning electron microscope and positioning the wafer stage at respective nominal positions of each reference pattern, each reference pattern is scanned. After determining at least a first and a second intensity profile for each pattern, a reference position offset from each nominal position is calculated. The reference position offsets are used to determine a positioning error of the scanning electron microscope.

Abstract: A method for the removal of water or aqueous liquids from the sump of an underground cavity, especially a cavern, is based on providing a process in which a water-miscible organic liquid is added to the sump, and then the mixture formed in this way is extracted from the cavity.