Patents by Inventor Uwe LUCKEN

Uwe LUCKEN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High-resolution amplitude contrast imaging
    Patent number: 9412558
    Abstract: A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.
    Type: Grant
    Filed: February 14, 2014
    Date of Patent: August 9, 2016
    Assignees: UNIVERSITEIT ANTWERPEN, FEI COMPANY
    Inventors: Dirk Van Dyck, Uwe Lucken, Holger Stark, Sara Bals
  • High - Resolution Amplitude Contrast Imaging
    Publication number: 20150380211
    Abstract: A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.
    Type: Application
    Filed: February 14, 2014
    Publication date: December 31, 2015
    Inventors: Dirk VAN DYCK, Uwe LUCKEN, Holger STARK, Sara BALS