Abstract: The invention relates to an apparatus for the investigation of surface properties with a housing, a light source which directs light through an opening in the housing onto a surface to be investigated, with a first detector device which is arranged inside at a first pre-set angle with respect to the light beam radiated onto the surface by the light source, with a second detector device which is arranged at a second pre-set angle with respect to the light beam radiated onto the surface by the light source and with a third detector device which is arranged inside the housing at a third pre-set angle with respect to the light beam radiated onto the surface by the light source.

Abstract: Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Abstract: The invention relates to an apparatus for the investigation of surface properties with a housing, a light source which directs light through an opening in the housing onto a surface to be investigated, with a first detector device which is arranged inside at a first pre-set angle with respect to the light beam radiated onto the surface by the light source, with a second detector device which is arranged at a second pre-set angle with respect to the light beam radiated onto the surface by the light source and with a third detector device which is arranged inside the housing at a third pre-set angle with respect to the light beam radiated onto the surface by the light source.

Abstract: A method of determining optical properties of textured surfaces by irradiation of the surface to be investigated. At least part of the radiation irradiated onto the surface and reflected by the latter is detected by a detector device which permits a location-resolved evaluation of the radiation striking it. A first characteristic value from the radiation detected, characteristic of a texture of the surface is detected. A second characteristic value from the radiation detected, characteristic of a further optical property of the surface is detected. And, a result value is determined on the basis of the first characteristic value and the second characteristic value.

Abstract: Radiation is irradiated by an irradiation device at a pre-set angle of incidence with respect to the surface onto the surface to be investigated, and the radiation scattered and/or reflected by this surface arrives at a radiation detector device arranged at a pre-set detection angle with respect to the surface and having an image-recording unit which records black-and-white images, wherein this radiation detector device permits a spatially resolved detection of the radiation reaching it. The irradiation device directs radiation in a first wavelength range onto the surface and the image-recording unit records a first spatially resolved image of this radiation scattered and/or reflected from the surface and the irradiation device directs radiation in a second wavelength range onto the surface and the image-recording unit records a second spatially resolved image of this radiation scattered and/or reflected from the surface.

Abstract: A method for optical investigation of textured surfaces involves the steps of irradiation of radiation onto the surface to be investigated; reception of an image from at least part of the radiation irradiated onto the surface and reflected by the surface; location-resolved evaluation of the image recorded and determination of at least one value K which is characteristic of this image. A parameter G which is characteristic of the surface is determined while using the characteristic value K and while using at least one further property E known beforehand or determined of the surface.

Abstract: A colour measuring unit (1) comprising a radiation device (2) which emits light onto a surface (9) to be examined, wherein the radiation device (2) comprises at least one semiconductor-based light source (6), and a radiation detector device (12) which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device (12) allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device (10) which determines at least one electrical parameter of the light source (6), and also a processor device (14) which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device (2).

Abstract: A method for the optical investigation of textured surfaces (10) with the steps: irradiation of radiation onto the surface (10) to be investigated; reception of an image from at least part of the radiation irradiated onto the surface (10) and reflected by the surface (10); location-resolved evaluation of the image recorded and determination of at least one value (K) which is characteristic of this image. According to the invention a parameter (G) which is characteristic of the surface is determined whilst using the characteristic value (K) and whilst using at least one further property (E)—known beforehand or determined—of the surface (10).

Abstract: A method of determining properties of textured surfaces with the steps: irradiation of radiation onto the surface (10) to be investigated; detection of at least part of the radiation irradiated onto the surface (10) and reflected by the latter by means of a detector device (4) which permits a location-resolved evaluation of the radiation striking it; determination of a first characteristic value (?P) from the radiation detected, wherein the first characteristic value (?P) is characteristic of a texture of the surface (10); determination of a second characteristic value (?E) from the radiation detected, wherein the second characteristic value is characteristic of a further optical property of the surface (10); determination of a result value (?I) on the basis of the first characteristic value (?P) and the second characteristic value (?E).

Abstract: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analyzed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analyzed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analyzed.

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device emitting radiation to a surface to be examined at least at a first predetermined spatial angle, at least one first detector for capturing the radiation emitted to and reflected back from the surface, wherein the detector, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface. At least one spatial angle at which the radiation device and/or the detector are positioned, is variable and the radiation device and the detector are positioned in a space at least part of which exhibits light-reflecting properties.

Abstract: A device for determining properties of surfaces having at least one first radiation device having at least one radiation source emitting radiation, having at least one first radiation detector having a first radiation detector element which captures at least a portion of the radiation emitted from the radiation device and subsequently diffused and/or reflected off a measuring surface and emits at least one measuring signal characteristic of the reflected/diffused radiation, and at least one second radiation detector having a second radiation detector element capturing a portion of the radiation from the radiation device and diffused/reflected off a measuring surface and outputs a measuring signal characteristic of the reflected and/or diffused radiation, and at least one filter device which is placeable both in the optical path between the radiation device and the first radiation detector and in the optical path between the radiation device and the second radiation detector.

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract: A method and a device for a spatially resolved examination and evaluation of the properties of surfaces, in particular such properties of surfaces which affect the optical impression which the surface makes. A defined radiation is directed at a first predetermined solid angle to an examined surface. Furthermore, at least a portion of the radiation affected by the examined surface in particular by diffusion and reflection, is detected at a second predefined solid angle. At least one measured variable is spatially resolved captured which characterizes at least one predetermined property of the radiation affected by the examined surface. At least over a portion of the spatially resolved measured values at least one statistical parameter for characterizing the surface is determined.

Abstract: A colour measuring unit (1) comprising a radiation device (2) which emits light onto a surface (9) to be examined, wherein the radiation device (2) comprises at least one semiconductor-based light source (6), and a radiation detector device (12) which receives at least a portion of the light scattered by the surface and outputs a signal characteristic of this light, wherein the radiation detector device (12) allows a spectral analysis of the light impinging thereon. According to the invention, the colour measuring unit comprises at least one sensor device (10) which determines at least one electrical parameter of the light source (6), and also a processor device (14) which outputs from this measured parameter at least one value characteristic of the light emitted by the radiation device (2).

Abstract: A device for examining the optical properties of surfaces includes a first radiation source which emits radiation to an examination surface, at least one first detector device, for detecting the radiation reflected off the surface and emitting at least one signal that is characteristic of at least one parameter of the detected radiation, wherein the detector device includes a plurality of image capturing components arranged in a specified detection area and wherein a control is provided for compensating signal changes caused by a shift of the location where the reflected radiation is incident on the detection area.

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle, at least one first detector device for capturing the radiation emitted to and reflected back from the surface wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface, and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract: A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.

Abstract: The present invention relates to a device and method for making quantified determinations of the quality of surfaces and wherein the device comprises an optical system with a first optical means and a second optical means as well as a control and evaluation means and an output (display) means. Said first optical means comprises an illuminating means having at least one LED as its light source and serves the function of illuminating the measurement surface at a predetermined angle. Said second optical means is likewise directed at a predetermined angle to the measurement surface and receives the reflected light. A photo sensor of said second optical means emits an electrical measurement signal which is characteristic of said reflected light. The light emitted from the illuminating means is configured such that its spectral characteristic comprises blue, green and red spectral components in the visible light spectrum.

Abstract: An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analysed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analysed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analysed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analysed.