Patents by Inventor Václav Batelka

Václav Batelka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Illumination apertures for extended sample lifetimes in helical tomography
    Patent number: 11430633
    Abstract: Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.
    Type: Grant
    Filed: December 29, 2020
    Date of Patent: August 30, 2022
    Assignee: FEI Company
    Inventors: Ondrej L. Shanel, Trond Karsten Varslot, Martin Schneider, Maarten Kuijper, Ondrej R. Baco, Václav Batelka
  • ILLUMINATION APERTURES FOR EXTENDED SAMPLE LIFETIMES IN HELICAL TOMOGRAPHY
    Publication number: 20220208511
    Abstract: Apertures having references edges are situated to define a sample irradiation zone and a shielded zone. The sample irradiation zone includes a portion proximate the shielded zone that is conjugate to a detector. A sample is scanned into the sample irradiation zone from the shielded zone so that the sample can remain unexposed until situated properly with respect to the detector for imaging. Irradiation exposure of the sample is reduced, permitting superior imaging.
    Type: Application
    Filed: December 29, 2020
    Publication date: June 30, 2022
    Applicant: FEI Company
    Inventors: Ondrej L. Shanel, Trond Karsten Varslot, Martin Schneider, Maarten Kuijper, Ondrej R. Baco, Václav Batelka