Patents by Inventor Vadim Arkadievich Markel

Vadim Arkadievich Markel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7034303
    Abstract: A methodology and concomitant system for the reconstruction of an object from measurements of the transmitted intensity of scattered radiation effected by irradiating the object with a source of radiation. The measurements of the transmitted intensity are both spatially sampled and limited. The transmitted intensity is related to either the absorption coefficient or diffusion coefficient, or both, of the object by an integral operator. The image is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the transmitted intensity of the scattered radiation. In a preferred embodiment, the data is measured using a paraxial arrangement composed on a single source and a small number of on-axis and off-axis detectors with the arrangement being moved over the measurement surface to measure the set of sampled and limited data.
    Type: Grant
    Filed: June 27, 2003
    Date of Patent: April 25, 2006
    Assignee: Washington University
    Inventors: John Carl Schotland, Vadim Arkadievich Markel
  • Publication number: 20040262520
    Abstract: A methodology and concomitant system for the reconstruction of an object from measurements of the transmitted intensity of scattered radiation effected by irradiating the object with a source of radiation. The measurements of the transmitted intensity are both spatially sampled and limited. The transmitted intensity is related to either the absorption coefficient or diffusion coefficient, or both, of the object by an integral operator. The image is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the transmitted intensity of the scattered radiation. In a preferred embodiment, the data is measured using a paraxial arrangement composed on a single source and a small number of on-axis and off-axis detectors with the arrangement being moved over the measurement surface to measure the set of sampled and limited data.
    Type: Application
    Filed: June 27, 2003
    Publication date: December 30, 2004
    Inventors: John Carl Schotland, Vadim Arkadievich Markel
  • Publication number: 20040085536
    Abstract: A methodology and concomitant system for the nonlinear reconstruction of an object from measurements of the transmitted intensity of scattered radiation effected by irradiating the object with a source of radiation. The transmitted intensity is related to either the absorption coefficient or diffusion coefficient, or both, of the object by an integral operator. The image is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the transmitted intensity of the scattered radiation. The mathematical algorithm includes computing a functional series expansion for the coefficient(s) in powers of the transmitted intensity.
    Type: Application
    Filed: November 1, 2002
    Publication date: May 6, 2004
    Inventors: John Carl Schotland, Vadim Arkadievich Markel, Joseph Andrew O'Sullivan
  • Patent number: 6628747
    Abstract: A methodology and concomitant system for three-dimensional near-field microscopy achieves subwavelength resolution of an object without retrieval of the optical phase. The features of this approach are three-fold: (i) the near-field phase problem is circumvented by employing measurements of the power extinguished from probe fields; (ii) the fields on which the power measurements are performed may be monitored far from the object and thus subwavelength resolution is obtained from far zone measurements; and (iii) by developing an analytic approach to the inverse problem in the form of an explicit inversion formula, an image reconstruction algorithm is produced which is strikingly robust in the presence of noise.
    Type: Grant
    Filed: June 21, 2002
    Date of Patent: September 30, 2003
    Assignee: Washington University in St. Louis
    Inventors: John Carl Schotland, Vadim Arkadievich Markel, Paul Scott Carney