Patents by Inventor Vadym D. Berkout
Vadym D. Berkout has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8440964Abstract: A device and method for transporting ions along a longitudinal direction in an elevated gas pressure region. The device includes a multipole ion guide having a set of rods positioned along the longitudinal direction on an inscribed diameter equal to or less than 3.5 mm, a voltage source which provides alternating voltages to at least a subset of the rods to create a trapping field in a transverse direction, and a conductance limit having an opening d and placed at the exit of the multipole ion guide. At the end of this configuration near the opening of the conductance limit, a converging continuum gas flow through the conductance limit is provided that transfers the ions collimating near a center of the ion guide into a low gas pressure region. The method injects ions into the elevated gas pressure region of the ion guide, and transports the ions in the converging continuum gas flow into the low gas pressure region.Type: GrantFiled: August 19, 2011Date of Patent: May 14, 2013Assignee: Science and Engineering Services, Inc.Inventors: Vadym D Berkout, Vladimir M. Doroshenko
-
Publication number: 20130043382Abstract: A device and method for transporting ions along a longitudinal direction in an elevated gas pressure region. The device includes a multipole ion guide having a set of rods positioned along the longitudinal direction on an inscribed diameter equal to or less than 3.5 mm, a voltage source which provides alternating voltages to at least a subset of the rods to create a trapping field in a transverse direction, and a conductance limit having an opening d and placed at the exit of the multipole ion guide. At the end of this configuration near the opening of the conductance limit, a converging continuum gas flow through the conductance limit is provided that transfers the ions collimating near a center of the ion guide into a low gas pressure region. The method injects ions into the elevated gas pressure region of the ion guide, and transports the ions in the converging continuum gas flow into the low gas pressure region.Type: ApplicationFiled: August 19, 2011Publication date: February 21, 2013Applicant: Science & Engineering Services, Inc.Inventors: Vadym D. BERKOUT, Vladimir M. Doroshenko
-
Patent number: 8188423Abstract: A method for fragmentation of analyte ions for mass spectroscopy and a system for mass spectroscopy. The method produces gas-phase analyte ions, produces gas-phase odd-electron containing species separately from the analyte ions, and mixes the gas-phase analyte ions and the odd-electron containing species at substantially atmospheric pressure conditions to produce fragment ions prior to introduction into a mass spectrometer. The system includes a gas-phase analyte ion source, a gas-phase odd-electron containing species source separate from the gas-phase analyte ion source, a mixing region where the gas-phase analyte ions and the odd-electron containing species are mixed at substantially atmospheric pressure to produce fragment ions of the analyte ions, a mass spectrometer having an entrance where at least a portion of the fragment ions are introduced into a vacuum of the mass spectrometer, and a detector in the mass spectrometer which determines a mass to charge ratio analysis of the fragment ions.Type: GrantFiled: May 21, 2010Date of Patent: May 29, 2012Assignee: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Vadym D. Berkout, Andrey Vilkov
-
Publication number: 20100288920Abstract: A method for fragmentation of analyte ions for mass spectroscopy and a system for mass spectroscopy. The method produces gas-phase analyte ions, produces gas-phase odd-electron containing species separately from the analyte ions, and mixes the gas-phase analyte ions and the odd-electron containing species at substantially atmospheric pressure conditions to produce fragment ions prior to introduction into a mass spectrometer. The system includes a gas-phase analyte ion source, a gas-phase odd-electron containing species source separate from the gas-phase analyte ion source, a mixing region where the gas-phase analyte ions and the odd-electron containing species are mixed at substantially atmospheric pressure to produce fragment ions of the analyte ions, a mass spectrometer having an entrance where at least a portion of the fragment ions are introduced into a vacuum of the mass spectrometer, and a detector in the mass spectrometer which determines a mass to charge ratio analysis of the fragment ions.Type: ApplicationFiled: May 21, 2010Publication date: November 18, 2010Applicant: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Vadym D. Berkout, Andrey Vilkov
-
Patent number: 7397029Abstract: An apparatus for mass analyzing molecules includes a mass spectrometer configured to select precursor ions having a mass to charge ratio range, a metastable species generator configured to generate a metastable species for introduction into the mass spectrometer, and a mass detector configured to detect a mass of the product ions. The apparatus also includes interaction region in the mass spectrometer where the precursor ions are converted into product ions via interaction of the precursor ions with the metastable species. The mass spectrometer includes at least one of a three-dimensional ion trap, a linear ion trap, or an ion guide. The interaction region is located inside the three-dimensional ion trap, the linear trap, or the ion guide; and at least one of the precursor ions or at least one of the product ions are excited by an alternating electric field or collisionally activated to produce additional product ions.Type: GrantFiled: January 5, 2007Date of Patent: July 8, 2008Assignee: Science & Engineering Services, Inc.Inventors: Vadym D. Berkout, Vladimir M. Doroshenko
-
Patent number: 7365315Abstract: An apparatus for analyzing a sample material includes a desorption mechanism configured to desorb molecules from the sample material, a metastable generator separate from the desorption mechanism and configured to generate a metastable species, and an interaction region configured for metastable species ionization of the desorbed molecules so as to produce gas-phase ions of the sample material.Type: GrantFiled: June 6, 2005Date of Patent: April 29, 2008Assignee: Science & Engineering Services, Inc.Inventors: Vadym D. Berkout, Vladimir M. Doroshenko
-
Patent number: 7170051Abstract: An apparatus for mass analyzing molecules includes a mass spectrometer configured to select precursor ions having a mass to charge ratio range, a metastable species generator configured to generate a metastable species for introduction into the mass spectrometer, and a mass detector configured to detect a mass of the product ions. The apparatus also includes interaction region in the mass spectrometer where the precursor ions fragment into product ions via interaction of the precursor ions with the metastable species.Type: GrantFiled: May 11, 2005Date of Patent: January 30, 2007Assignee: Science & Engineering Services, Inc.Inventors: Vadym D. Berkout, Vladimir M. Doroshenko
-
Patent number: 7161146Abstract: A method and system for producing an ion beam from an ion guide. In the method, ions are introduced into the ion guide, a radio frequency trapping field is generated in the ion guide to confine ions in a direction transverse to a longitudinal axis of the ion guide, a DC potential is generated along the longitudinal axis to direct ion motion along the longitudinal axis, a strength of the radio frequency trapping field is reduced toward an ion guide exit of the ion guide, and the ions are transmitted from the ion guide exit to form the ion beam. In the system, an ion guide is configured to transmit ions in a longitudinal axis of the ion guide and configured to trap ions in a direction transverse to the longitudinal axis via a radio frequency trapping field. The ion guide includes a segmented set of electrodes spaced along the longitudinal axis and an ion guide exit at the last of the segmented set of electrodes.Type: GrantFiled: January 24, 2005Date of Patent: January 9, 2007Assignee: Science & Engineering Services, Inc.Inventors: Vladimir M. Doroshenko, Vadym D. Berkout
-
Patent number: 6858840Abstract: A system and method for mass analysis of an ion beam. The system includes a mass selector, at least one multipole ion guide, and a mass analyzer. In the system and method, precursor ions are selected with a desired mass to charge ratio. Electrons are injected into the multipole ion guide. The precursor ions are fragmented into product ions via electron capture dissociation from the injected electrons. The product ions are passed to a mass analyzer for a mass analysis.Type: GrantFiled: May 20, 2003Date of Patent: February 22, 2005Assignee: Science & Engineering Services, Inc.Inventors: Vadym D. Berkout, Vladimir M. Doroshenko
-
Publication number: 20040232324Abstract: A system and method for mass analysis of an ion beam. The system includes a mass selector, at least one multipole ion guide, and a mass analyzer. In the system and method, precursor ions are selected with a desired mass to charge ratio. Electrons are injected into the multipole ion guide. The precursor ions are fragmented into product ions via electron capture dissociation from the injected electrons. The product ions are passed to a mass analyzer for a mass analysis.Type: ApplicationFiled: May 20, 2003Publication date: November 25, 2004Applicant: Science & Engineering Services, Inc.Inventors: Vadym D. Berkout, Vladimir M. Doroshenko