Patents by Inventor Vahe GHAZIKHANIAN

Vahe GHAZIKHANIAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200240776
    Abstract: Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface. The first radiation causes the material layer to emit secondary radiation. A filter is positioned between the material layer and a radiation detector and in the beam path of the second radiation in order to attenuate a portion of the second radiation associated with fluorescence of the material to emit third radiation. Then, the radiation detector is configured to detect the third radiation and a controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation.
    Type: Application
    Filed: January 29, 2020
    Publication date: July 30, 2020
    Applicant: NDC Technologies Inc.
    Inventors: Vahe GHAZIKHANIAN, Ahmad R. SHISHEGAR