Patents by Inventor Val Gont

Val Gont has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7873203
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Grant
    Filed: August 29, 2008
    Date of Patent: January 18, 2011
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Patent number: 7643665
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: January 5, 2010
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Patent number: 7580557
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Grant
    Filed: August 29, 2008
    Date of Patent: August 25, 2009
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Publication number: 20080317327
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Application
    Filed: August 29, 2008
    Publication date: December 25, 2008
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Publication number: 20080317328
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Application
    Filed: August 29, 2008
    Publication date: December 25, 2008
    Inventors: Vyacheslav L. Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Publication number: 20070256037
    Abstract: The present invention provides an accurate and efficient method of organizing circuitry from a net-list of an integrated circuit, by the steps of generating a reference pattern; identifying the potential matches in the net-list using inexact graph matching; further analyzing the matches to determine if they match the reference pattern; and organizing the net-list into a hierarchy by replacing the identified instances with higher-level representations.
    Type: Application
    Filed: April 26, 2006
    Publication date: November 1, 2007
    Inventors: Vyacheslav Zavadsky, Edward Keyes, Sergei Sourjko, Val Gont, Stephen Begg, Jason Abt
  • Patent number: 7278121
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: October 2, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale McIntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Patent number: 7207018
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Grant
    Filed: August 4, 2004
    Date of Patent: April 17, 2007
    Assignee: Semiconductor Insights Inc.
    Inventors: Vyacheslav L. Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Patent number: 7013028
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: March 14, 2006
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam
  • Publication number: 20060045325
    Abstract: The present invention involves a computationally efficient method of determining the locations of standard cells in an image of an IC layout. The initial step extracts and characterizes points of interest of the image. A coarse localization of possible standard cell locations is performed and is based on a comparison of the points of interest of an instance of an extracted standard cell and the remaining points of interest in the image. A more rigid comparison is made on the list of possible locations comprising a coarse match and a fine match. The coarse match results in a shortlist of possible locations. The fine match performs comparisons between the template and the shortlist. Further filtering is done to remove the effects of noise and texture variations and statistics on the results are generated to achieve the locations of the standard cells on the IC layout.
    Type: Application
    Filed: August 31, 2004
    Publication date: March 2, 2006
    Inventors: Vyacheslav Zavadsky, Val Gont, Edward Keyes, Jason Abt, Stephen Begg
  • Publication number: 20060041849
    Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.
    Type: Application
    Filed: August 23, 2004
    Publication date: February 23, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale Mclntyre, Mohammed Ouali, Vyacheslav Zavadsky
  • Publication number: 20060031792
    Abstract: The method and apparatus in accordance with the present invention determines the locations of incorrectly connected polygons in a polygon representation of an integrated circuit layout. These incorrectly connected polygons result in short circuits, which often occur for major signal busses such as power and ground. It can be time-consuming to determine the exact location of the short. The invention includes the step of tessellating the polygon representation, including each conductive layer, into predetermined shapes such as triangles or trapezoids. Each of the triangles or trapezoids is then translated into a node for the development of a nodal network where nodes are connected directly to one another to represent shapes having edges adjacent to other shape edges. The current capacity of each connection between adjacent nodes is then specified. Two nodes that are electrically connected to the incorrectly connected polygons are selected and used as parameters for a network flow analysis algorithm.
    Type: Application
    Filed: August 4, 2004
    Publication date: February 9, 2006
    Applicant: Semiconductor Insights Inc.
    Inventors: Vyacheslav Zavadsky, Elmehdi Aitnouri, Edward Keyes, Jason Abt, Val Gont, Stephen Begg
  • Patent number: 6738957
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Grant
    Filed: August 3, 2001
    Date of Patent: May 18, 2004
    Assignee: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20020023107
    Abstract: A process in a computer system for generating a high level schematic from a project schematic of basic components which comprises scanning the project schematic for a predetermined cell, wherein the cell is made up of a select group of components and their interconnections, and replacing the select group of components on every occurrence that it is found in the project schematic by a cell symbol having input and outputs to generate the high level schematic. The process may also be repeated for other predetermined cells which may be selected from a library or created by the user.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 21, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam, Alexei Ioudovski
  • Publication number: 20020018583
    Abstract: An editor in a computer system for editing an schematic having a number of pages. The editor may cut a selected portion of the schematic from any one of the schematic pages, paste the cut portion of the schematic onto any one of the schematic pages, and connect nets located on the same schematic page. The editor may search for objects such as signal labels and cells within the schematic netlist as well as other editing functions. Further a navigator is provided for interactively viewing netlist data from a high level schematic where the data includes schematic page numbers, cell names, nets, signal labels and segments. The project viewer software and project schematic netlist data may be contained in a computer-readable medium. The project viewer software controls output schematic images and enables a user to view, trace and search objects throughout the project netlist data.
    Type: Application
    Filed: August 3, 2001
    Publication date: February 14, 2002
    Applicant: Semiconductor Insights Inc.
    Inventors: Val Gont, Jason Abt, Larry Lam