Patents by Inventor Valerie Peidous

Valerie Peidous has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for inspection of spherical surfaces
    Patent number: 11047675
    Abstract: Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.
    Type: Grant
    Filed: May 27, 2019
    Date of Patent: June 29, 2021
    Inventors: Valerie Peidous, Vassili Peidous, Nina Peydus
  • METHOD AND APPARATUS FOR INSPECTION OF SPHERICAL SURFACES
    Publication number: 20200378755
    Abstract: Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.
    Type: Application
    Filed: May 27, 2019
    Publication date: December 3, 2020
    Inventors: Valerie Peidous, Vassili Peidous, Nina Peydus