Patents by Inventor Valery Deich

Valery Deich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240085333
    Abstract: A method, a system, and a non-transitory computer readable medium for accurate Raman spectroscopy. The method may include executing at least one iteration of the steps of: (i) performing, by an optical measurement system, a calibration process that comprises (a) finding a misalignment between a region of interest defined by a spatial filter, and an impinging beam of radiation that is emitted from an illuminated area of a sample, the impinging beam impinges on the spatial filter; and (b) determining a compensating path of propagation of the impinging beam that compensates the misalignment; and (ii) performing a measurement process, while the optical measurement system is configured to provide the compensating path of propagation of the impinging beam, to provide one or more Raman spectra.
    Type: Application
    Filed: August 18, 2023
    Publication date: March 14, 2024
    Applicant: NOVA LTD.
    Inventors: Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich, Shimon YALOV, Gilad BARAK
  • Patent number: 11740183
    Abstract: A method, a system, and a non-transitory computer readable medium for accurate Raman spectroscopy. The method may include executing at least one iteration of the steps of: (i) performing, by an optical measurement system, a calibration process that comprises (a) finding a misalignment between a region of interest defined by a spatial filter, and an impinging beam of radiation that is emitted from an illuminated area of a sample, the impinging beam impinges on the spatial filter; and (b) determining a compensating path of propagation of the impinging beam that compensates the misalignment; and (ii) performing a measurement process, while the optical measurement system is configured to provide the compensating path of propagation of the impinging beam, to provide one or more Raman spectra.
    Type: Grant
    Filed: November 24, 2020
    Date of Patent: August 29, 2023
    Assignee: Nova Ltd.
    Inventors: Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich, Shimon Yalov, Gilad Barak
  • Publication number: 20230044886
    Abstract: A method, a system, and a non-transitory computer readable medium for accurate Raman spectroscopy. The method may include executing at least one iteration of the steps of: (i) performing, by an optical measurement system, a calibration process that comprises (a) finding a misalignment between a region of interest defined by a spatial filter, and an impinging beam of radiation that is emitted from an illuminated area of a sample, the impinging beam impinges on the spatial filter; and (b) determining a compensating path of propagation of the impinging beam that compensates the misalignment; and (ii) performing a measurement process, while the optical measurement system is configured to provide the compensating path of propagation of the impinging beam, to provide one or more Raman spectra.
    Type: Application
    Filed: November 24, 2020
    Publication date: February 9, 2023
    Applicant: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Elad Schleifer, Yonatan Oren, Amir Shayari, Eyal Hollander, Valery Deich, Shimon YALOV, Gilad BARAK
  • Publication number: 20210396511
    Abstract: A measurement system is presented configured for integration with a processing equipment for applying optical measurements to a structure.
    Type: Application
    Filed: November 17, 2019
    Publication date: December 23, 2021
    Applicant: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Elad DOTAN, Moshe VANHOTSKER, Shimon YALOV, Valery DEICH, Roi RINGEL, Beni SHULMAN, Yossi BAR ON, Shahar BASSON
  • Patent number: 10739277
    Abstract: A measurement system is presented for use in metrology measurements on patterned samples. The system comprises: at least one light source device configured to generate broadband light, at least one detection device configured to provide spectral information of detected light, and an optical system. The optical system comprises at least an oblique channel system for directing incident light generated by the light source(s) along an oblique illumination channel onto a measurement plane, on which a sample is to be located, and directing broadband light specularly reflected from the sample along a collection channel to the detection device(s). The optical system further comprises an interferometric unit comprising a beam splitting/combining device and a reference reflector device.
    Type: Grant
    Filed: April 21, 2016
    Date of Patent: August 11, 2020
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Yoav Berlatzky, Valery Deich, Dror Shafir, Danny Grossman
  • Publication number: 20190128823
    Abstract: A measurement system is presented for use in metrology measurements on patterned samples. The system comprises: at least one light source device configured to generate broadband light, at least one detection device configured to provide spectral information of detected light, and an optical system. The optical system comprises at least an oblique channel system for directing incident light generated by the light source(s) along an oblique illumination channel onto a measurement plane, on which a sample is to be located, and directing broadband light specularly reflected from the sample along a collection channel to the detection device(s). The optical system further comprises an interferometric unit comprising a beam splitting/combining device and a reference reflector device.
    Type: Application
    Filed: April 21, 2016
    Publication date: May 2, 2019
    Inventors: Yoav BERLATZKY, Valery DEICH, Dror SHAFIR, Danny GROSSMAN
  • Patent number: 6590654
    Abstract: An apparatus and method for enhancing the proportion of detected light that has been diffusely scattered by a surface light to light specularly reflected from the surface. A beam of light having a direction of predominant polarization is directed through a wedge module so as to illuminate the scene. The wedge module has two optically anisotropic wedges and an optical compensation plate. The polarization axes of the first and second wedges are substantially parallel to the direction of predominant polarization of the illuminating beam. Light scattered by the surface is detected through a polarizer.
    Type: Grant
    Filed: February 16, 2001
    Date of Patent: July 8, 2003
    Assignee: Optimet, Optical Metrology Ltd.
    Inventors: Gabriel Y. Sirat, Yaacov Zerem, Meny Shy, Valery Deich