Abstract: A socket for establishing a releasable connection between terminals of electronic modules and a circuit board includes a base having a module support surface for supporting the module in test position. A contact holder cooperates with the base for supporting contact elements for each terminal of the module. Each of the contact modules include a projecting portion projecting from the socket and before engagement with the circuit board, a support section which is supported on the contact holder in grooves defined between ribs and oriented with respect thereto by tabs on the contact elements engaging gaps in the grooves, and a deflecting section which extends over slots in the contact holder. When a module to be tested, the module is placed on the test surface and a lid pivotally mounted on the socket is closed to thereby push the terminals into engagement with the contact elements and thereafter downward force being accommodated by deflection of the deflectable portion of the contact elements into the grooves.

Abstract: A test contactor for establishing a releasable connection between terminals of an integrated circuit electronic module to be tested and a circuit board connected to test equipment includes a housing carrying a contact element for each terminal of the module. Each contact element includes a contact surface which is engaged by the corresponding terminal of the modules when testing is effected. The contact surface is connected to a pad which connects the contact element to the circuit board by a spring arm that is slidably engaged with the pad. Accordingly, as the contact element is deflected during testing, the spring arm slides along the pad, and the resiliency of the contact element restores itself it is initial condition when the module is removed. The spring arm provides the shortest possible electrical path between the contact surface and the pad, thereby assuring a high frequency response.