Patents by Inventor Van-Duc Nguyen
Van-Duc Nguyen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240065194Abstract: The disclosure relates to a 5G communication system or a 6G communication system for supporting higher data rates beyond a 4G communication system such as long term evolution (LTE). In a wireless communication system, a method performed by a first user equipment (UE) may include: obtaining at least one phone number from a plurality of usable sources, classifying, based on a usage state, the at least one phone number into one of a permanent state, a temporary state, or an invalid state, and transmitting a session initiation protocol (SIP) message including information associated with the at least one classified phone number to a second UE.Type: ApplicationFiled: August 24, 2023Publication date: February 29, 2024Inventors: Ngoc Duc NGUYEN, The Nghia NGUYEN, Van Khanh NGUYEN, Thi Tam TRUONG
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Publication number: 20200388462Abstract: Systems and methods for tuning and/or calibrating a charged particle beam apparatus are disclosed. According to certain embodiments, a reference specimen comprises a substrate having a plurality of first objects at a first pitch, and a plurality of second objects at a second pitch. Regions containing the first and second objects may overlap. A method of tuning and/or calibrating may comprise analyzing an image of a sample at a plurality of coarseness levels, determining whether a parameter of the image satisfies a criteria based on measured characteristics of the image at the coarseness levels, and adjusting the parameter.Type: ApplicationFiled: December 4, 2018Publication date: December 10, 2020Inventors: Van-Duc NGUYEN, Xiong XIAO, Dongdong WU, Chi Michael MAI, Chien-Hung CHOU
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Patent number: 9436985Abstract: This invention relates to methods and systems for enhance the signal-to-noise ratio of an image scanned by a charged particle beam. In an embodiment, a sequence of grayscales of a pixel is recorded first, extreme values of the sequence of grayscales are then identified and removed, and the remained grayscales are used to determine a nominated grayscale of the pixel.Type: GrantFiled: January 13, 2015Date of Patent: September 6, 2016Assignee: HERMES MICROVISION INC.Inventors: Chiyan Kuan, Joe Wang, Van-Duc Nguyen
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Patent number: 9400176Abstract: The present invention generally relates to dynamic focus adjustment for an image system. With the assistance of a height detection sub-system, present invention provides an apparatus and methods for micro adjusting an image focusing according the specimen surface height variation by altering the field strength of an electrostatic lens between objective lens and sample stage/or a bias voltage applied to the sample surface. Merely by way of example, the invention has been applied to a scanning electron inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as observation tool with a height detection apparatus.Type: GrantFiled: June 17, 2014Date of Patent: July 26, 2016Assignee: HERMES MICROVISION, INC.Inventors: Joe Wang, Van-Duc Nguyen, Yi-Xiang Wang, Jack Jau, Zhong-Wei Chen
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Patent number: 9002097Abstract: This invention relates to methods and systems for enhance the signal-to-noise ratio of an image scanned by a charged particle beam. In an embodiment, a sequence of grayscales of a pixel is recorded first, extreme values of the sequence of grayscales are then identified and removed, and the remained grayscales are used to determine a nominated grayscale of the pixel.Type: GrantFiled: February 26, 2013Date of Patent: April 7, 2015Assignee: Hermes Microvision Inc.Inventors: Chiyan Kuan, Joe Wang, Van-Duc Nguyen
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Publication number: 20140291517Abstract: The present invention generally relates to dynamic focus adjustment for an image system. With the assistance of a height detection sub-system, present invention provides an apparatus and methods for micro adjusting an image focusing according the specimen surface height variation by altering the field strength of an electrostatic lens between objective lens and sample stage/or a bias voltage applied to the sample surface. Merely by way of example, the invention has been applied to a scanning electron inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as observation tool with a height detection apparatus.Type: ApplicationFiled: June 17, 2014Publication date: October 2, 2014Inventors: JOE WANG, VAN-DUC NGUYEN, YI-XIANG WANG, JACK JAU, ZHONG-WEI CHEN
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Patent number: 8791414Abstract: The present invention generally relates to dynamic focus adjustment for an image system. With the assistance of a height detection sub-system, present invention provides an apparatus and methods for micro adjusting an image focusing according the specimen surface height variation by altering the field strength of an electrostatic lens between objective lens and sample stage/or a bias voltage applied to the sample surface. Merely by way of example, the invention has been applied to a scanning electron inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as observation tool with a height detection apparatus.Type: GrantFiled: April 21, 2010Date of Patent: July 29, 2014Assignee: Hermes Microvision, Inc.Inventors: Joe Wang, Van-Duc Nguyen, Yi-Xiang Wang, Jack Jau, Zhongwei Chen
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Publication number: 20110260055Abstract: The present invention generally relates to dynamic focus adjustment for an image system. With the assistance of a height detection sub-system, present invention provides an apparatus and methods for micro adjusting an image focusing according the specimen surface height variation by altering the field strength of an electrostatic lens between objective lens and sample stage/or a bias voltage applied to the sample surface. Merely by way of example, the invention has been applied to a scanning electron inspection system. But it would be recognized that the invention could apply to other system using charged particle beam as observation tool with a height detection apparatus.Type: ApplicationFiled: April 21, 2010Publication date: October 27, 2011Applicant: HERMES MICROVISION, INC.Inventors: JOE WANG, VAN-DUC NGUYEN, YI-XIANG WANG, JACK JAU, ZHONGWEI CHEN
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Publication number: 20110254776Abstract: An improved portable electronic device includes a touch-sensitive display and a text input routine that employs an error correction routine. The error correction routine evaluates inputs to determine whether they are ambiguous based upon the actual location of the input and with the use of a linguistic database. The error correction routine is suspended for a single input immediately following a deletion input, after which the error correction routine is automatically reactivated. In the example embodiment described herein, the error correction routine is suspended for a single input by ignoring the output of the error correction routine, after which the output of the error correction routine is not ignored for subsequent inputs.Type: ApplicationFiled: April 20, 2010Publication date: October 20, 2011Inventors: Michael Elizarov, Dai Van Duc Nguyen
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Patent number: 7767982Abstract: A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto the surface of the specimen. The pattern is associated with the pattern plate. Additionally, the method includes detecting the illumination flux reflected from the surface of the specimen with a detector, processing information associated with the detected illumination flux, and generating a first image based on at least information associated with the detected illumination flux. The first image includes a first image part for the pattern and a second image part for the specimen. Moreover, the method includes adjusting the lens to a state in order to achieve a first predetermined quality for the first image part, and moving the specimen to a first position.Type: GrantFiled: June 6, 2007Date of Patent: August 3, 2010Assignee: Hermes-Microvision, Inc.Inventors: Yi Xiang Wang, Van-Duc Nguyen, Jian Zhang
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Publication number: 20100010932Abstract: A system and method is provided for registering a user or a wireless device and executing a transaction of funds from a third party account to a prepaid account. The wireless device is in secure communication with an administrating server over a network. The administrating server is in communication with a third party entity, via a third party entity server, as well as with a prepaid server. In the initial registration process, the user provides the credentials for accessing the third party account using the wireless device. The credentials are stored on the wireless device, administrating server, or both. In subsequent transactions, the user enters in the amount to be deposited into the prepaid account and the credentials are automatically retrieved from storage for authentication. If authenticated, the transaction is executed by the administrating server.Type: ApplicationFiled: July 9, 2009Publication date: January 14, 2010Inventors: Simon Law, Dennis Taksing Poon, Razim Farid Samy, Jim Chi-Yin Law, Dai Van Duc Nguyen
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Publication number: 20080302974Abstract: A method and system for inspecting a semiconductor wafer. The method includes providing an illumination flux through a pattern plate and a lens to a surface of a specimen to project a pattern onto the surface of the specimen. The pattern is associated with the pattern plate. Additionally, the method includes detecting the illumination flux reflected from the surface of the specimen with a detector, processing information associated with the detected illumination flux, and generating a first image based on at least information associated with the detected illumination flux. The first image includes a first image part for the pattern and a second image part for the specimen. Moreover, the method includes adjusting the lens to a state in order to achieve a first predetermined quality for the first image part, and moving the specimen to a first position.Type: ApplicationFiled: June 6, 2007Publication date: December 11, 2008Applicant: Hermes-Microvision, Inc.Inventors: Yi Xiang Wang, Van-Duc Nguyen, Jian Zhang
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Patent number: 7327857Abstract: A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined reference image) of an ideal model for the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the ideal model for the object. A transformation estimator compares the scanned image to the reference image and provides a transform which maps the scanned image to the reference image and provides a set of registered object data points. One or more filter modules process the registered object data points with a priori information to reduce noise and to further enhance the accuracy and precision of the registration. A gauge estimator is coupled to the filter module.Type: GrantFiled: March 9, 2004Date of Patent: February 5, 2008Assignee: General Electric CompanyInventors: Thomas Watkins Lloyd, Jr., Joseph Benjamin Ross, Glen William Brooksby, Van-Duc Nguyen, John Lewis Schneiter, Steven Jeffrey Gordon, Faycal Benayad-Cherif, Victor Nzomigni, Donald Hamilton
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Publication number: 20050201611Abstract: A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined reference image) of an ideal model for the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the ideal model for the object. A transformation estimator compares the scanned image to the reference image and provides a transform which maps the scanned image to the reference image and provides a set of registered object data points. One or more filter modules process the registered object data points with a priori information to reduce noise and to further enhance the accuracy and precision of the registration. A gauge estimator is coupled to the filter module.Type: ApplicationFiled: March 9, 2004Publication date: September 15, 2005Inventors: Thomas Watkins Lloyd, Joseph Benjamin Ross, Glen William Brooksby, Van-Duc Nguyen, John Lewis Schneiter, Steven Jeffrey Gordon, Faycal Benayad-Cherif, Victor Nzomigni, Donald Hamilton
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Patent number: 6748112Abstract: The present invention is directed to an imaging apparatus for examining an object having smooth surfaces to determine shape deformations in the surface of object. The imaging apparatus includes an imaging device for obtaining a scanned image of the object to be examined. A reference image of the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the object. The image register stores patch information corresponding to both the reference image and the scanned image. A transformation estimator is coupled to the image register, and provides a transform for registering the scanned image to the reference image. A deformation estimator is coupled to the transformation estimator and to the image register. The deformation estimator is configured to utilize the transform and the patch information to determine shape deformations of the object.Type: GrantFiled: July 15, 1999Date of Patent: June 8, 2004Assignee: General Electric CompanyInventors: Van-Duc Nguyen, Roderic Greene Collins, Victor Nzomigni, Donald Wagner Hamilton, Jr., Charles Vernon Stewart, Joseph Legrand Mundy
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Patent number: 6690841Abstract: A machine vision system includes an apparatus for registering an input image of an object, such as an aircraft engine blade, to a reference image comprising ideal specifications for the object in order to detect flaws in the object. The system includes one or more imaging devices for obtaining the input image representing the object. The system further includes a processor for registering the input image to the reference image. The processor includes a patch determining device for identifying low curvature portions of the reference image off-line. A transformation estimator matches the low curvature portions of the reference image to corresponding low curvature portions of the object, and provides a transformation matrix which maps points on the reference image 11 to corresponding points on the input image for precise and fast registration.Type: GrantFiled: February 27, 2002Date of Patent: February 10, 2004Assignee: General Electric CompanyInventors: Van-Duc Nguyen, Victor Nzomigni, Charles Vernon Stewart
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Patent number: 6504957Abstract: A machine vision system includes an apparatus for registering an input image of an object, such as an aircraft engine blade, to a reference image comprising ideal specifications for the object in order to detect flaws in the object. The system includes one or more imaging devices for obtaining the input image representing the object. The system further includes a processor for registering the input image to the reference image. The processor includes a patch determining device for identifying low curvature portions of the reference image off-line. A transformation estimator matches the low curvature portions of the reference image to corresponding low curvature portions of the object, and provides a transformation matrix which maps points on the reference image 11 to corresponding points on the input image for precise and fast registration.Type: GrantFiled: February 27, 2002Date of Patent: January 7, 2003Assignee: General Electric CompanyInventors: Van-Duc Nguyen, Victor Nzomigni, Charles Vernon Stewart
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Publication number: 20020118892Abstract: A machine vision system includes an apparatus for registering an input image of an object, such as an aircraft engine blade, to a reference image comprising ideal specifications for the object in order to detect flaws in the object. The system includes one or more imaging devices for obtaining the input image representing the object. The system further includes a processor for registering the input image to the reference image. The processor includes a patch determining device for identifying low curvature portions of the reference image off-line. A transformation estimator matches the low curvature portions of the reference image to corresponding low curvature portions of the object, and provides a transformation matrix which maps points on the reference image 11 to corresponding points on the input image for precise and fast registration.Type: ApplicationFiled: February 27, 2002Publication date: August 29, 2002Inventors: Van-Duc Nguyen, Victor Nzomigni, Charles Vernon Stewart
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Publication number: 20020118893Abstract: A machine vision system includes an apparatus for registering an input image of an object, such as an aircraft engine blade, to a reference image comprising ideal specifications for the object in order to detect flaws in the object. The system includes one or more imaging devices for obtaining the input image representing the object. The system further includes a processor for registering the input image to the reference image. The processor includes a patch determining device for identifying low curvature portions of the reference image off-line. A transformation estimator matches the low curvature portions of the reference image to corresponding low curvature portions of the object, and provides a transformation matrix which maps points on the reference image 11 to corresponding points on the input image for precise and fast registration.Type: ApplicationFiled: February 27, 2002Publication date: August 29, 2002Inventors: Van-Duc Nguyen, Victor Nzomigni, Charles Vernon Stewart
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Patent number: 6411915Abstract: A method for calibrating a non-contact range sensor comprises the steps of employing the range sensor to obtain a range image of an object to be inspected. The range image is registered with a reference image of the object thereby providing registered data. The reference image may be derived through computer assisted drawing (CAD) data. Normal deviations between the registered data and the reference image are computed. Noise is filtered from the normal deviations. A plurality of bias vectors and a covariance matrix are estimated based on the normal deviations, stored in memory as a lookup table comprising geometric correction factors for the sensor. Images of the object subsequently obtained by the sensor are compensated in accordance with the lookup table.Type: GrantFiled: July 23, 1999Date of Patent: June 25, 2002Assignee: General Electric CompanyInventors: Van-Duc Nguyen, Victor Nzomigni, Charles Vernon Stewart, Kishore Bubna, Lila Abdessemed, Nathalie Claire Poirier