Abstract: The disclosed method and apparatus enables the testing of multiple embedded memory arrays associated with multiple processor cores on a single computer chip. According to one aspect, the disclosed method and apparatus identifies certain rows and columns within each of the embedded memory arrays that need to be disabled and also identifies certain redundant rows and columns in the embedded memory array to be activated. According to another aspect, the disclosed method and apparatus generates a map indicating where each of the memory failures occurs in each embedded memory array. If the testing process determines that the embedded memory array cannot be repaired, then a signal is provided directly to an external testing device indicating that the embedded memory array is non-repairable.

Abstract: Tools for expanding downhole tubulars into each other or in open hole are disclosed. One embodiment uses a movable cone biased by Bellville washers to move longitudinally against such bias and allow collets to move radially in or out to a predetermined maximum diameter. A release system allows collet retraction to avoid hang up on removal. In an alternate embodiment, more suitable for open hole applications, pressurized gas pushes a movable cone longitudinally against the collets. A stationary cone is on the opposite side of the collets from the movable cone. The collet rides out or in between the cones and raises the gas pressure when forced in. A pressure actuated release allows the lower cone to shift downwardly to allow the collets to retract for removal.

Abstract: A dispenser for dispensing flat media comprises a media storage bin at a first end and a discharge chute at a second end, with a coarse media separator located adjacent the media storage bin and a rear conveyor which is intermittently driven to convey the media towards a singulation separator, having a front conveyor which delivers media to a transport conveyor and to a discharge chute. A sensor senses media at a location just before the singulation separator. Media from the bottom of the storage bin are pass through the coarse media separator and lie on the rear conveyor in shingled arrangement, and are pulled into the singulation separator one at a time. The rear conveyor works only when the sensor senses the absence of media.

Abstract: The disclosed method and apparatus enables the testing of multiple embedded memory arrays associated with multiple processor cores on a single computer chip. According to one aspect, the disclosed method and apparatus identifies certain rows and columns within each of the embedded memory arrays that need to be disabled and also identifies certain redundant rows and columns in the embedded memory array to be activated. According to another aspect, the disclosed method and apparatus generates a map indicating where each of the memory failures occurs in each embedded memory array. If the testing process determines that the embedded memory array cannot be repaired, then a signal is provided directly to an external testing device indicating that the embedded memory array is non-repairable.