Abstract: A memory device including a controller for handling thermal shutdown of the memory device. The control system acquires temperatures of a plurality of non-volatile memory elements in the memory device from one or more temperature detectors at a first frequency. Upon determining that the temperature of one of the plurality of non-volatile memory elements is above a threshold, the controller activates thermal throttling for the plurality of non-volatile memory elements and flushes metadata from a volatile memory element in the memory device to the plurality of non-volatile memory elements for future recovery of the memory device.

Abstract: Embodiments of a SSD include a controller coupled to one or more flash dies, one or more temperature sensors proximate to the one or more flash dies, and data storing instructions. The one or more flash dies includes a plurality of TLC (triple level cell) blocks. The controller when executing the data storing instructions cause the controller to periodically fetch a temperature reading from the one or more temperature sensors and limit operations to the one or more flash dies when the temperature reading is above a start throttling threshold. In certain embodiments, TLC blocks are written to in a SLC mode when the temperature reading is above the start throttling threshold. In other embodiments, one or more spare SLC blocks are written to with non-system data during throttling.

Abstract: The temperature of the various devices on a printed circuit board (PCB) can change over time as the PCB is used. Additionally, the various devices on the PCB can have different temperatures at the same time. For example, the closer a device is to a heat source, the greater the temperature. Similarly, the further away from the heat source, the lower the temperature. Thus, otherwise identical devices on a PCB can have different temperatures at the same time, and additionally, the temperatures can change over time. By periodically measuring the temperature of the devices, the thermal disparity for the devices can be efficiently and intelligently managed.

Abstract: The present disclosure discloses a memory device including a controller for handling thermal shutdown of the memory device. The control system acquires temperatures of a plurality of non-volatile memory elements in the memory device from one or more temperature detectors at a first frequency. Upon determining that the temperature of one of the plurality of non-volatile memory elements is above a threshold, the controller activates thermal throttling for the plurality of non-volatile memory elements and flushes metadata from a volatile memory element in the memory device to the plurality of non-volatile memory elements for future recovery of the memory device.

Abstract: The present disclosure discloses a memory device including a controller for handling thermal shutdown of the memory device. The control system acquires temperatures of a plurality of non-volatile memory elements in the memory device from one or more temperature detectors at a first frequency. Upon determining that the temperature of one of the plurality of non-volatile memory elements is above a threshold, the controller activates thermal throttling for the plurality of non-volatile memory elements and flushes metadata from a volatile memory element in the memory device to the plurality of non-volatile memory elements for future recovery of the memory device.