Patents by Inventor Vasily Isaenko

Vasily Isaenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Security protection domain-based testing framework
    Patent number: 8959485
    Abstract: Methods and apparatus for security protection domain-based testing. A testing framework enables the same certification tests to be run across different protection domains or operation modes, and on different platforms or devices. The testing framework may, for example, be directed to testing implementations of the Java Platform, Micro Edition (Java ME®) using Connected Device Configuration (CDC) or Connected Limited Device Configuration (CLDC) as the configuration layer and Mobile Information Device Profile (MIDP) as the profile layer. Different Mobile Information Device Profile (MIDP) specifications (e.g., MIDP 2.x and MIDP 3.x specifications) may be supported. The testing framework may be deployed in the context of compatibility testing and technology compatibility kits (TCKs). The testing framework may, for example, be applied in compatibility testing for Java ME® platform technology implementations.
    Type: Grant
    Filed: June 25, 2012
    Date of Patent: February 17, 2015
    Assignee: Oracle International Corporation
    Inventors: Boris Kvartskhava, Vasily Isaenko, Alexander Alexeev
  • Security Protection Domain-Based Testing Framework
    Publication number: 20130254832
    Abstract: Methods and apparatus for security protection domain-based testing. A testing framework enables the same certification tests to be run across different protection domains or operation modes, and on different platforms or devices. The testing framework may, for example, be directed to testing implementations of the Java Platform, Micro Edition (Java ME®) using Connected Device Configuration (CDC) or Connected Limited Device Configuration (CLDC) as the configuration layer and Mobile Information Device Profile (MIDP) as the profile layer. Different Mobile Information Device Profile (MIDP) specifications (e.g., MIDP 2.x and MIDP 3.x specifications) may be supported. The testing framework may be deployed in the context of compatibility testing and technology compatibility kits (TCKs). The testing framework may, for example, be applied in compatibility testing for Java ME® platform technology implementations.
    Type: Application
    Filed: June 25, 2012
    Publication date: September 26, 2013
    Inventors: Boris Kvartskhava, Vasily Isaenko, Alexander Alexeev