Abstract: This disclosure provides systems, devices, apparatus, and methods, including computer programs encoded on storage media, for dynamic field switching based on a head pose. A processor computes a difference between a first pose corresponding to a rendering time instance for a frame and a second pose corresponding to a display time instance for the frame that occurs after the rendering time instance. The processor renders a first set of color fields or a second set of color fields for the frame based on the computed difference and a threshold, where the first set of color fields and the second set of color fields include a first number of color fields and a second number of color fields, respectively, where the first number is less than the second number. The processor outputs an indication of the rendered first set of color fields or the rendered second set of color fields.

Abstract: This disclosure provides systems, devices, apparatus, and methods, including computer programs encoded on storage media, for histogram based AR/MR object image edge sharpening/enhancement. A display processor may obtain an image of an environment captured by a camera and a frame that is to be displayed. The display processor may compute a first histogram based on the image and a second histogram based on the frame. The display processor may add noise to the frame based on the first histogram and the second histogram, where the noise is distinguishable from at least a portion of the image. The display processor may transmit the frame including the noise for display on a display device.

Abstract: A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.

Abstract: A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.