Abstract: A memory device includes a plurality of memory cells, each including a switching device and an information storage device connected to the switching device and having a phase change material, the plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, a decoder circuit determining at least one of the plurality of memory cells to be a selected memory cell, and a program circuit configured to input a programming current to the selected memory cell to perform a programming operation and configured to detect a resistance of the selected memory cell to adjust a magnitude of the programming current.

Abstract: A memory device includes a plurality of memory cells, each including a switching device and an information storage device connected to the switching device and having a phase change material, the plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, a decoder circuit determining at least one of the plurality of memory cells to be a selected memory cell, and a program circuit configured to input a programming current to the selected memory cell to perform a programming operation and configured to detect a resistance of the selected memory cell to adjust a magnitude of the programming current.

Abstract: A memory device includes a plurality of memory cells, each including a switching device and an information storage device connected to the switching device and having a phase change material, the plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, a decoder circuit determining at least one of the plurality of memory cells to be a selected memory cell, and a program circuit configured to input a programming current to the selected memory cell to perform a programming operation and configured to detect a resistance of the selected memory cell to adjust a magnitude of the programming current.

Abstract: A memory device includes a memory cell array including a plurality of memory cells arranged at points where a plurality of word lines and a plurality of bit lines intersect; a sense amplifier configured to amplify, in a read operation mode of the memory device, a voltage difference value between a voltage of a selected word line connected to a selected memory cell of the plurality of memory cells and a reference voltage; and a leakage current compensation circuit connected to a selected word line path between the selected memory cell and the sense amplifier and configured to compensate for a total leakage current generated by unselected memory cells connected to the selected word line in the read operation mode.

Abstract: A memory device includes a memory cell connected to a word line and a bit line, a row driver that drives the word line to a precharge level, a column driver that drives the bit line to a first target level, a sense amplifier that senses a first sensing level of the word line after the first target level is applied to the memory cell, and a read control circuit that controls the column driver so that a second target level different from the first target level is selectively applied to the memory cell depending on the first sensing level sensed by the sense amplifier.

Abstract: A memory device includes a plurality of memory cells, each including a switching device and an information storage device connected to the switching device and having a phase change material, the plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, a decoder circuit determining at least one of the plurality of memory cells to be a selected memory cell, and a program circuit configured to input a programming current to the selected memory cell to perform a programming operation and configured to detect a resistance of the selected memory cell to adjust a magnitude of the programming current.

Abstract: A memory device includes a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines; a decoder circuit including a first bias circuit inputting a first bias voltage to a selected word line, and a second bias circuit inputting a second bias voltage to a selected bit line, a first switch element connected to the selected word line, and a second switch element connected between the first switch element and the first bias circuit; and a control logic configured to control the first and second switch elements, when a predetermined delay time elapses after the second bias voltage is input to the selected bit line. The control logic turns off the first switch element while the second switch element is turned on.

Abstract: A memory device includes a memory cell connected to a word line and a bit line, a row driver that drives the word line to a precharge level, a column driver that drives the bit line to a first target level, a sense amplifier that senses a first sensing level of the word line after the first target level is applied to the memory cell, and a read control circuit that controls the column driver so that a second target level different from the first target level is selectively applied to the memory cell depending on the first sensing level sensed by the sense amplifier.

Abstract: A memory device includes a memory cell array including a plurality of memory cells arranged at points where a plurality of word lines and a plurality of bit lines intersect; a sense amplifier configured to amplify, in a read operation mode of the memory device, a voltage difference value between a voltage of a selected word line connected to a selected memory cell of the plurality of memory cells and a reference voltage; and a leakage current compensation circuit connected to a selected word line path between the selected memory cell and the sense amplifier and configured to compensate for a total leakage current generated by unselected memory cells connected to the selected word line in the read operation mode.

Abstract: A memory device includes a memory cell array including a plurality of memory cells arranged at points where a plurality of word lines and a plurality of bit lines intersect; a sense amplifier configured to amplify, in a read operation mode of the memory device, a voltage difference value between a voltage of a selected word line connected to a selected memory cell of the plurality of memory cells and a reference voltage; and a leakage current compensation circuit connected to a selected word line path between the selected memory cell and the sense amplifier and configured to compensate for a total leakage current generated by unselected memory cells connected to the selected word line in the read operation mode.

Abstract: A memory device may include a memory cell array including a plurality of memory cells and a compensation resistor electrically connected to the memory cell array. The compensation resistor may generate a cell current compensating for a voltage drop generated in a parasitic resistor of a signal line connected to at least one memory cell of the plurality of memory cells. The compensation circuit may control a magnitude of resistance of a compensation resistor upon receiving an address corresponding to the memory cell. The compensation circuit may increase a magnitude of the cell current based on adjusting the magnitude of resistance of the compensation resistor to be substantially equal to a resistance value of the parasitic resistor.

Abstract: A memory device includes a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines; a decoder circuit including a first bias circuit inputting a first bias voltage to a selected word line, and a second bias circuit inputting a second bias voltage to a selected bit line, a first switch element connected to the selected word line, and a second switch element connected between the first switch element and the first bias circuit; and a control logic configured to control the first and second switch elements, when a predetermined delay time elapses after the second bias voltage is input to the selected bit line. The control logic turns off the first switch element while the second switch element is turned on.

Abstract: A memory device includes: a memory cell array, multiple bit lines, a compensation circuit, a holding circuit, and a control logic circuit. The memory cell array includes multiple memory cells. Each of the bit lines is connected to at least one of the memory cells. Among the bit lines, a predetermined voltage is applied to selected bit lines connected to selected memory cells. The compensation circuit includes a sampling circuit that generates a sampling value by sensing a leakage current applied to non-selected memory cells from among the plurality of memory cells. The holding circuit compensates for a voltage applied to the selected bit lines, based on the sampling value. The control logic circuit outputs a sampling-enable signal that controls enabling of the sampling circuit and a holding-enable signal that controls enabling of the holding circuit.

Abstract: A memory device includes a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, each of the plurality of memory cells including a switching element and an information storage element connected to the switching element and containing a phase-change material, a decoder unit configured to determine a selected word line and a selected bit line connected to a selected memory cell to read data, among the plurality of memory cells, and a current compensation circuit configured to remove a leakage current from the selected word line, the leakage current corresponding to a sun of off-currents flowing in unselected bit lines, excluding the selected bit line, among the plurality of bit lines, from the selected word line.

Abstract: A memory device includes a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines, each of the plurality of memory cells including a switching element and an information storage element connected to the switching element and containing a phase-change material, a decoder unit configured to determine a selected word line and a selected bit line connected to a selected memory cell to read data, among the plurality of memory cells, and a current compensation circuit configured to remove a leakage current from the selected word line, the leakage current corresponding to a sun of off-currents flowing in unselected bit lines, excluding the selected bit line, among the plurality of bit lines, from the selected word line.

Abstract: A memory device may include a memory cell array including a plurality of memory cells and a compensation resistor electrically connected to the memory cell array. The compensation resistor may generate a cell current compensating for a voltage drop generated in a parasitic resistor of a signal line connected to at least one memory cell of the plurality of memory cells. The compensation circuit may control a magnitude of resistance of a compensation resistor upon receiving an address corresponding to the memory cell. The compensation circuit may increase a magnitude of the cell current based on adjusting the magnitude of resistance of the compensation resistor to be substantially equal to a resistance value of the parasitic resistor.

Abstract: A memory device includes: a memory cell array, multiple bit lines, a compensation circuit, a holding circuit, and a control logic circuit. The memory cell array includes multiple memory cells. Each of the bit lines is connected to at least one of the memory cells. Among the bit lines, a predetermined voltage is applied to selected bit lines connected to selected memory cells. The compensation circuit includes a sampling circuit that generates a sampling value by sensing a leakage current applied to non-selected memory cells from among the plurality of memory cells. The holding circuit compensates for a voltage applied to the selected bit lines, based on the sampling value. The control logic circuit outputs a sampling-enable signal that controls enabling of the sampling circuit and a holding-enable signal that controls enabling of the holding circuit.

Abstract: A memory device includes a memory cell array including a plurality of memory cells arranged at points where a plurality of word lines and a plurality of bit lines intersect; a sense amplifier configured to amplify, in a read operation mode of the memory device, a voltage difference value between a voltage of a selected word line connected to a selected memory cell of the plurality of memory cells and a reference voltage; and a leakage current compensation circuit connected to a selected word line path between the selected memory cell and the sense amplifier and configured to compensate for a total leakage current generated by unselected memory cells connected to the selected word line in the read operation mode.

Abstract: A nonvolatile memory device includes a voltage generating circuit configured to generate voltages applied to word lines corresponding to a selected memory block among memory blocks. The voltage generating circuit includes voltage source lines having linear voltages, a first voltage generating unit configured to generate a first voltage and apply the generated first voltage to a first voltage source line among the voltage source lines, a second voltage generating unit configured to generate a second voltage and apply the generated second voltage to a second voltage source line among the voltage source lines, and a linear voltage generator having a resistor string connected between the first voltage source line and the second voltage source line. At least one of the voltage source lines has a voltage distributed between the first voltage and the second voltage.

Abstract: A clock signal generation device includes a variable voltage providing circuit, a fixed voltage providing circuit and a clock signal generating circuit. The variable voltage providing circuit provides a variable reference voltage based on a selection signal, a reference voltage and a temperature coefficient. The variable reference voltage is varied according to temperature. The fixed voltage providing circuit provides a fixed reference voltage that is determined according to the selection signal. The fixed reference voltage is a constant voltage. The clock signal generating circuit provides a clock signal based on the fixed reference voltage and the variable reference voltage. The performance of the clock signal generation device may be increased by providing the clock signal based on the variable reference voltage that is varied according to the temperature and based on the fixed reference voltage.