Abstract: An example includes a circuit including a first AND gate including a first input terminal, a second input terminal, and an output terminal, a second AND gate including a first input terminal, a second input terminal, and an output terminal, and a third AND gate including a first input terminal, a second input terminal, and an output terminal. The circuit also includes an OR gate including a first input terminal coupled to the output terminal of the first AND gate, a second input terminal coupled to the output terminal of the second AND gate, a third input terminal coupled to the output terminal of the third AND gate, and an output terminal.

Abstract: An integrated circuit includes: a clock domain having a clock domain input; and clock management logic coupled to the clock domain. The clock management logic includes: a PLL having a reference clock input and a PLL clock output; a divider having a divider input and a divider output, the divider input coupled to the PLL clock output; and bypass logic having a first clock input, a second clock input, a bypass control input, and a bypass logic output, the first clock input coupled to divider output, the second clock input coupled to the reference clock input, and the bypass logic output coupled to the clock domain input. The bypass logic selectively bypasses the PLL and divider responsive to a bypass control signal triggered by a reset signal. The reset signal also triggers a reset control signal delayed relative to the bypass control signal.

Abstract: An electronic device comprising one or more subcircuits configured to receive a clock signal, the clock signal configured to switch from a reference clock signal to a second clock signal based on a clock bypass signal, a timer configured to receive the reference clock signal and output an alignment signal based on the reference clock signal, wherein a frequency of the alignment signal is determined based on clock frequencies of the one or more subcircuits; a clock alignment module coupled to the timer and the one or more subcircuits and configured to receive the clock bypass signal, determine that the clock bypass signal has changed to switch the one or more subcircuits to the reference clock signal from the second clock signal, block the clock signal from being received by the one or more subcircuits, receive the alignment signal, and unblock the clock signal based on the alignment signal.

Abstract: An integrated circuit includes a processor core configured to perform boot operations; and a microcontroller coupled to a processor core. The microcontroller includes: a set of microcontroller components; and a state machine coupled to the set of microcontroller components. The state machine is configured to perform self-test operations on the set of microcontroller components before the boot operations.

Abstract: An electronic device comprising one or more subcircuits configured to receive a clock signal, the clock signal configured to switch from a reference clock signal to a second clock signal based on a clock bypass signal, a timer configured to receive the reference clock signal and output an alignment signal based on the reference clock signal, wherein a frequency of the alignment signal is determined based on clock frequencies of the one or more subcircuits; a clock alignment module coupled to the timer and the one or more subcircuits and configured to receive the clock bypass signal, determine that the clock bypass signal has changed to switch the one or more subcircuits to the reference clock signal from the second clock signal, block the clock signal from being received by the one or more subcircuits, receive the alignment signal, and unblock the clock signal based on the alignment signal.

Abstract: An electronic device comprising one or more subcircuits configured to receive a clock signal, the clock signal configured to switch from a reference clock signal to a second clock signal based on a clock bypass signal, a timer configured to receive the reference clock signal and output an alignment signal based on the reference clock signal, wherein a frequency of the alignment signal is determined based on clock frequencies of the one or more subcircuits; a clock alignment module coupled to the timer and the one or more subcircuits and configured to receive the clock bypass signal, determine that the clock bypass signal has changed to switch the one or more subcircuits to the reference clock signal from the second clock signal, block the clock signal from being received by the one or more subcircuits, receive the alignment signal, and unblock the clock signal based on the alignment signal.

Abstract: An integrated circuit includes a processor core configured to perform boot operations; and a microcontroller coupled to a processor core. The microcontroller includes: a set of microcontroller components; and a state machine coupled to the set of microcontroller components. The state machine is configured to perform self-test operations on the set of microcontroller components before the boot operations.

Abstract: Disclosed embodiments include an electronic system with a power on reset (POR) circuit. The POR circuit includes first voltage detection circuitry to perform a first detection on a supply voltage and to output a first control signal in response to the first detection, second voltage detection circuitry to perform a second detection on the supply voltage and to output a second control signal in response to the second detection, and third voltage detection circuitry to perform a third detection on the supply voltage and to output at least one third control signal in response to the third detection. The POR circuit further has sequencing circuitry with a first input to receive the at least one third control signal and to output a reset signal in response to the at least one third control signal.

Abstract: A system on a chip (SOC) is configured to support multiple time domains within a time-sensitive networking (TSN) environment. TSN extends Ethernet networks to support a deterministic and high-availability communication on Layer 2 (data link layer of open system interconnect “OSI” model) for time coordinated capabilities such as industrial automation and control applications. Processors in a system may have an application time domain separate from the communication time domain. In addition, each type time domain may also have multiple potential time masters to drive synchronization for fault tolerance. The SoC supports multiple time domains driven by different time masters and graceful time master switching. Timing masters may be switched at run-time in case of a failure in the system. Software drives the SoC to establish communication paths through a sync router to facilitate communication between time providers and time consumers. Multiple time sources are supported.

Abstract: A system on a chip (SOC) is configured to support multiple time domains within a time-sensitive networking (TSN) environment. TSN extends Ethernet networks to support a deterministic and high-availability communication on Layer 2 (data link layer of open system interconnect “OSI” model) for time coordinated capabilities such as industrial automation and control applications. Processors in a system may have an application time domain separate from the communication time domain. In addition, each type time domain may also have multiple potential time masters to drive synchronization for fault tolerance. The SoC supports multiple time domains driven by different time masters and graceful time master switching. Timing masters may be switched at run-time in case of a failure in the system. Software drives the SoC to establish communication paths through a sync router to facilitate communication between time providers and time consumers. Multiple time sources are supported.

Abstract: An integrated circuit includes: a clock domain having a clock domain input; and clock management logic coupled to the clock domain. The clock management logic includes: a PLL having a reference clock input and a PLL clock output; a divider having a divider input and a divider output, the divider input coupled to the PLL clock output; and bypass logic having a first clock input, a second clock input, a bypass control input, and a bypass logic output, the first clock input coupled to divider output, the second clock input coupled to the reference clock input, and the bypass logic output coupled to the clock domain input. The bypass logic selectively bypasses the PLL and divider responsive to a bypass control signal triggered by a reset signal. The reset signal also triggers a reset control signal delayed relative to the bypass control signal.

Abstract: A functional safety POR system requires implementing voltage detectors and supervisory functions in a complex SOC. These features are implemented within the SOC without external components. Three stages of voltage monitoring are implemented to ensure redundancy.

Abstract: An integrated circuit includes: a clock domain having a clock domain input; and clock management logic coupled to the clock domain. The clock management logic includes: a PLL having a reference clock input and a PLL clock output; a divider having a divider input and a divider output, the divider input coupled to the PLL clock output; and bypass logic having a first clock input, a second clock input, a bypass control input, and a bypass logic output, the first clock input coupled to divider output, the second clock input coupled to the reference clock input, and the bypass logic output coupled to the clock domain input. The bypass logic selectively bypasses the PLL and divider responsive to a bypass control signal triggered by a reset signal. The reset signal also triggers a reset control signal delayed relative to the bypass control signal.

Abstract: An integrated circuit includes a processor core configured to perform boot operations; and a microcontroller coupled to a processor core. The microcontroller includes: a set of microcontroller components; and a state machine coupled to the set of microcontroller components. The state machine is configured to perform self-test operations on the set of microcontroller components before the boot operations.

Abstract: An integrated circuit includes: a clock domain having a clock domain input; and clock management logic coupled to the clock domain. The clock management logic includes: a PLL having a reference clock input and a PLL clock output; a divider having a divider input and a divider output, the divider input coupled to the PLL clock output; and bypass logic having a first clock input, a second clock input, a bypass control input, and a bypass logic output, the first clock input coupled to divider output, the second clock input coupled to the reference clock input, and the bypass logic output coupled to the clock domain input. The bypass logic selectively bypasses the PLL and divider responsive to a bypass control signal triggered by a reset signal. The reset signal also triggers a reset control signal delayed relative to the bypass control signal.

Abstract: Disclosed embodiments include an electronic system with a power on reset (POR) circuit. The POR circuit includes first voltage detection circuitry to perform a first detection on a supply voltage and to output a first control signal in response to the first detection, second voltage detection circuitry to perform a second detection on the supply voltage and to output a second control signal in response to the second detection, and third voltage detection circuitry to perform a third detection on the supply voltage and to output at least one third control signal in response to the third detection. The POR circuit further has sequencing circuitry with a first input to receive the at least one third control signal and to output a reset signal in response to the at least one third control signal.

Abstract: Disclosed embodiments include an electronic system with a power on reset (POR) circuit. The POR circuit includes first voltage detection circuitry to perform a first detection on a supply voltage and to output a first control signal in response to the first detection, second voltage detection circuitry to perform a second detection on the supply voltage and to output a second control signal in response to the second detection, and third voltage detection circuitry to perform a third detection on the supply voltage and to output at least one third control signal in response to the third detection. The POR circuit further has sequencing circuitry with a first input to receive the at least one third control signal and to output a reset signal in response to the at least one third control signal.

Abstract: An example includes a circuit including a first AND gate including a first input terminal, a second input terminal, and an output terminal, a second AND gate including a first input terminal, a second input terminal, and an output terminal, and a third AND gate including a first input terminal, a second input terminal, and an output terminal. The circuit also includes an OR gate including a first input terminal coupled to the output terminal of the first AND gate, a second input terminal coupled to the output terminal of the second AND gate, a third input terminal coupled to the output terminal of the third AND gate, and an output terminal.

Abstract: The optimal operating voltage of a complex SoC may be influenced by process variations. The operating voltages may be dynamically adjusted for optimal performance. These adjustments require a dynamic reconfiguration of the voltage monitoring thresholds in the power on reset circuitry of the SoC.

Abstract: A functional safety POR system requires implementing voltage detectors and supervisory functions in a complex SOC. These features are implemented within the SOC without external components. Three stages of voltage monitoring are implemented to ensure redundancy.