Abstract: Beamforming codebook synthesis in a wireless communications system (WCS) is provided. A wireless node simultaneously emits multiple reference beams in a coverage area based on a set of codewords that is optimized for a specific number of antenna elements in an antenna array. The wireless node may need to emit the reference beams using a different number of the antenna elements in the antenna array. Herein, the wireless node is configured to determine a different set(s) of codewords that is fine tuned for forming an identical number of the reference beams from a different number of the antenna elements and steered toward identical directions. In addition, the wireless node can dynamically select an appropriate set of codewords in response to different operating conditions. As such, it is possible to switch transparently, from both wireless node and end user perspectives, between different antenna array configurations under different operating conditions.

Abstract: Multi-beam uniform coverage in a coverage cell(s) in a wireless communications system (WCS) is provided. The WCS includes a number of wireless devices that are typically mounted on a fixed structure to provide coverage for user devices. Each wireless device includes one or more antenna arrays. Each antenna array is controlled via a set of codewords to form one or more RF beams to each cover a respective area in a coverage cell. The codewords are predetermined based on fairness and/or leakage constraints such that the RF beams can be formed in desired geometric shapes and steered toward desired directions to provide a unform coverage in the coverage cell. By forming the RF beams based on the codewords predetermined based on fairness and/or leakage constraints, it is possible to ensure an equal RF power signal level inside the coverage cell and/or reduced power leakage outside the coverage cell.

Abstract: Coverage cluster-based beamforming in a wireless node in a wireless communications system (WCS) is provided. In a conventional beamforming system, a wireless node (e.g., base station) periodically emits multiple reference beams, each steered toward a predefined direction, to provide a blanket coverage in a coverage area. Contrary to providing the blanket coverage, a wireless node disclosed herein is configured to provide targeted coverage in a coverage area. Specifically, the wireless node is configured to dynamically group multiple coverage points (e.g., user equipment, high user density area, etc.) into multiple coverage clusters. Accordingly, the wireless node can form and steer a respective reference beam toward each of the coverage clusters.

Abstract: A method for processing a transparent workpiece that includes directing a laser beam the transparent workpiece. The laser beam incident to the impingement surface has an oblong angular spectrum and portion of the laser beam directed into the transparent workpiece is a laser beam focal line and generates an induced absorption to produce a defect within the transparent workpiece. The laser beam focal line includes a wavelength ?, a spot size wo, a Rayleigh range ZR that is greater than F D ? ? ? ? w o 2 ? , where FD is a dimensionless divergence factor comprising a value of 10 or greater, and an internal beam angle of greater than 10° relative to a plane orthogonal to an impingement surface at an impingement location, such that the defect has a defect angle within the transparent workpiece of greater than 10° relative to a plane orthogonal to the impingement surface at the impingement location.

Abstract: A method for processing a transparent workpiece that includes directing a laser beam the transparent workpiece. The laser beam incident to the impingement surface has an oblong angular spectrum and portion of the laser beam directed into the transparent workpiece is a laser beam focal line and generates an induced absorption to produce a defect within the transparent workpiece. The laser beam focal line includes a wavelength ?, a spot size wo, a Rayleigh range ZR that is greater than F D ? ? ? ? w o 2 ? , where FD is a dimensionless divergence factor comprising a value of 10 or greater, and an internal beam angle of greater than 10° relative to a plane orthogonal to an impingement surface at an impingement location, such that the defect has a defect angle within the transparent workpiece of greater than 10° relative to a plane orthogonal to the impingement surface at the impingement location.