Abstract: Power saving techniques are provided for processing circuitry on image sensors. Processing circuitry may include one or more processing blocks. The processing blocks may receive pixel data in the form of lines separated by blanking time. To reduce power consumption, each processing block may have a clock that is enabled when processing data and disabled during blanking time. The processing blocks may have respective clocks that are enabled and disabled at different times. Timing control circuitry may provide a clock enable signal to a first processing block. Each processing block may receive a clock enable signal and output a time-shifted clock enable signal for a subsequent processing block.

Abstract: Power saving techniques are provided for processing circuitry on image sensors. Processing circuitry may include one or more processing blocks. The processing blocks may receive pixel data in the form of lines separated by blanking time. To reduce power consumption, each processing block may have a clock that is enabled when processing data and disabled during blanking time. The processing blocks may have respective clocks that are enabled and disabled at different times. Timing control circuitry may provide a clock enable signal to a first processing block. Each processing block may receive a clock enable signal and output a time-shifted clock enable signal for a subsequent processing block.

Abstract: Method and system for testing an integrated circuit and more particularly, for determining timing associated with an input or output of an embedded circuit, in an integrated circuit for testing are described. A bit is adjustably delayed with a first adjustable delay to provide a delayed bit. The delayed bit is provided to a bus, such as an input bus for example, of the embedded circuit as a second vector. A third vector is output from the embedded circuit responsive to the second vector. A fourth vector is obtained having second multiple bits. The fourth vector is compared with the third vector to determine a period of delay associated with at least approximately a maximum operating frequency of the embedded circuit.