Abstract: An integrated circuit test socket is adapted to use with Kelvin connectors by creating closely spaced connectors and counter-rotating links that are nested to conserve space. The connectors are shaped to make contact with a chip and communicate force and sense signals to a tester, allowing a measure of the chip's actual resistance.

Abstract: An integrated circuit test socket includes a highly conductive compliant material that is cut and installed into the test socket. The conductive material draws electrical charge away from the test socket, leading to more accurate testing. The test socket base is grounded, and a ground current runs through the base and into conductive strips. The configuration forms an electromagnetic impulse shield, protecting the chip from electromagnetic interference. The compliance of the shield material allows the shield to be sealed when activated, ensuring that the electromagnetic impulse shield is complete around the semi-conductor chip.

Abstract: A socket mount for use in connection with an integrated circuit test socket having a body with fastener holes, a plurality of electrical connector links, and a plurality of elastomer elements biasing said links, the socket mount comprising a block having a flat upper surface, a flat lower surface, and four flat edges defining a square, and respective fastener holes aligned with the fastener holes in the test socket, a first groove oriented perpendicularly with respect to a flat edge along the flat lower surface, and a second groove oriented diagonally from a first edge to a second edge along the flat lower surface, the grooves having a length equal to a length of elastomer in the test socket.

Abstract: A socket mount for use in connection with an integrated circuit test socket having a body with fastener holes, a plurality of electrical connector links, and a plurality of elastomer elements biasing said links, the socket mount comprising a block having a flat upper surface, a flat lower surface, and four flat edges defining a square, and respective fastener holes aligned with the fastener holes in the test socket, a first groove oriented perpendicularly with respect to a flat edge along the flat lower surface, and a second groove oriented diagonally from a first edge to a second edge along the flat lower surface, the grooves having a length equal to a length of elastomer in the test socket.

Abstract: An improved test socket for testing or connecting an integrated circuit is disclosed having a platform for receiving the integrated circuit and adapted to overlay a piece of test equipment or other board, the platform formed with an array of slots each locating a portion of a two-piece connector assembly. The socket includes a conforming groove that captures an elastomer member therein while providing exposure of the elastomer member to a link assembly. The socket, with the capture groove, provides improved contact of the link assembly and reliability in locating and maintaining positioning of the elastomer member.