Patents by Inventor Victor Malherbe

Victor Malherbe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray detector
    Patent number: 11730433
    Abstract: An X-ray detector includes a first circuit with an NPN-type bipolar transistor and a second circuit configured to compare a voltage at a terminal of the NPN-type bipolar transistor with a reference value substantially equal to a value of the terminal voltage which would occur when the first circuit has been exposed to a threshold quantity of X-rays.
    Type: Grant
    Filed: November 18, 2021
    Date of Patent: August 22, 2023
    Assignees: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
    Inventors: Gilles Gasiot, Severin Trochut, Olivier Le Neel, Victor Malherbe
  • X-RAY DETECTOR
    Publication number: 20220160314
    Abstract: An X-ray detector includes a first circuit with an NPN-type bipolar transistor and a second circuit configured to compare a voltage at a terminal of the NPN-type bipolar transistor with a reference value substantially equal to a value of the terminal voltage which would occur when the first circuit has been exposed to a threshold quantity of X-rays.
    Type: Application
    Filed: November 18, 2021
    Publication date: May 26, 2022
    Applicants: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
    Inventors: Gilles GASIOT, Severin TROCHUT, Olivier LE NEEL, Victor MALHERBE
  • Measurement of the duration of a pulse
    Patent number: 10771048
    Abstract: A first circuit includes a first chain of identical stages defining first and second delay lines. A second circuit includes a second chain of identical stages defining third and fourth delay lines. The stages of the second chain are identical to the stages of the first chain. A third circuit selectively couples one of the third delay line, the fourth delay line, or a first input of the third circuit to an input of the first circuit.
    Type: Grant
    Filed: January 20, 2020
    Date of Patent: September 8, 2020
    Assignees: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
    Inventors: Capucine Lecat-Mathieu De Boissac, Fady Abouzeid, Gilles Gasiot, Philippe Roche, Victor Malherbe
  • MEASUREMENT OF THE DURATION OF A PULSE
    Publication number: 20200252059
    Abstract: A first circuit includes a first chain of identical stages defining first and second delay lines. A second circuit includes a second chain of identical stages defining third and fourth delay lines. The stages of the second chain are identical to the stages of the first chain. A third circuit selectively couples one of the third delay line, the fourth delay line, or a first input of the third circuit to an input of the first circuit.
    Type: Application
    Filed: January 20, 2020
    Publication date: August 6, 2020
    Applicants: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
    Inventors: Capucine LECAT-MATHIEU DE BOISSAC, Fady ABOUZEID, Gilles GASIOT, Philippe ROCHE, Victor MALHERBE
  • Radiation-hardened CMOS logic device
    Patent number: 9748955
    Abstract: A radiation-hardened logic device includes a first n-channel transistor coupled by its main conducting nodes between an output node of a logic device and a supply voltage rail and a first p-channel transistor coupled by its main conducting nodes between the output node of the logic device and a ground voltage rail. The gates of the first n-channel and p-channel transistors are coupled to the output node.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: August 29, 2017
    Assignee: STMicroelectronics (Crolles 2) SAS
    Inventors: Gilles Gasiot, Victor Malherbe, Sylvain Clerc