Patents by Inventor Victor Mazzio

Victor Mazzio has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and device for non-destructive Raman analysis
    Patent number: 8964286
    Abstract: A Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Grant
    Filed: March 21, 2014
    Date of Patent: February 24, 2015
    Assignee: Hologic Inc
    Inventor: Victor Mazzio
  • System and Device for Non-Destructive Raman Analysis
    Publication number: 20140204373
    Abstract: A Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Application
    Filed: March 21, 2014
    Publication date: July 24, 2014
    Applicant: Hologic, Inc.
    Inventor: Victor Mazzio
  • System and Device for Non-Destructive Raman Analysis
    Publication number: 20120268737
    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Application
    Filed: July 5, 2012
    Publication date: October 25, 2012
    Applicant: HOLOGIC, INC.
    Inventor: Victor Mazzio
  • Method for characterizing x-ray detector materials using a Raman microscope
    Patent number: 7907274
    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Grant
    Filed: July 24, 2008
    Date of Patent: March 15, 2011
    Assignee: Hologic, Inc.
    Inventor: Victor Mazzio
  • Method for Characterizing X-Ray Detector Materials Using a Raman Microscope
    Publication number: 20100020317
    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Application
    Filed: July 24, 2008
    Publication date: January 28, 2010
    Applicant: Hologic Corporation
    Inventor: Victor Mazzio
  • System and Device for Non-Destructive Raman Analysis
    Publication number: 20100020393
    Abstract: An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.
    Type: Application
    Filed: July 24, 2008
    Publication date: January 28, 2010
    Applicant: Hologic Inc.
    Inventor: Victor Mazzio