Abstract: A method includes receiving a circuit design and a specification for the circuit design and determining a first hypothesized change to the circuit design. Making the first hypothesized change to the circuit design produces a first changed circuit design. The method also includes determining a first counterexample input that causes the first changed circuit design to produce an output that departs from the specification and determining a second hypothesized change to the circuit design based at least in part on the first hypothesized change. Making the second hypothesized change to the circuit design produces a second changed circuit design. The method further includes, in response to determining that the second changed circuit design has no counterexample input that causes the second changed circuit design to produce an output that departs from the specification, making the second hypothesized change to the circuit design.

Abstract: Mechanisms are provided for optimizing an integrated circuit device design to obfuscate emissions corresponding to internal logic states of the integrated circuit device design. A first integrated circuit (IC) device design data structure is received and parsed to identify at least one instance of an obfuscation indicator in the data of the IC device design data structure. At least one IC logic element is marked, in the IC device design, which is associated with the at least one instance of the obfuscation indicator. At least one emission obfuscation optimization is applied to the marked at least one IC logic element to obfuscate emissions from the marked at least one IC logic element and generate an emissions obfuscated IC device design data structure. The emissions obfuscated IC device design data structure is output for fabrication of an IC device in accordance with the emissions obfuscated IC device design data structure.

Abstract: A system and method for using unreachable states of a circuit design in a testing mode to increase random testability of a random resistant logic circuit. Control-improving logic circuitry is integrated into a logic circuit design to improve its testability and will not affect behavior of the design in its functional mode (by remaining “inactive” in the functional mode of the integrated circuit). The control-improving logic circuitry is automatically activated in testing mode. The control improving logic circuit is generated selectively for random resistant logic circuit regions that exhibit limited controllability in the functional mode and improves controllability of random resistant logic in the testing mode. The improved controllability results from activating test circuitry in the states that are not reachable during normal functionality.

Abstract: A system and method for using unreachable states of a circuit design in a testing mode to increase random testability of a random resistant logic circuit. Control-improving logic circuitry is integrated into a logic circuit design to improve its testability and will not affect behavior of the design in its functional mode (by remaining “inactive” in the functional mode of the integrated circuit). The control-improving logic circuitry is automatically activated in testing mode. The control improving logic circuit is generated selectively for random resistant logic circuit regions that exhibit limited controllability in the functional mode and improves controllability of random resistant logic in the testing mode. The improved controllability results from activating test circuitry in the states that are not reachable during normal functionality.

Abstract: Mechanisms are provided for generating a logic design of an integrated circuit device. An initial logic design representation of the integrated circuit device is received and one or more areas of the initial logic design representation are identified where logic elements in the one or more areas can be replaced with one or more multiplexer tree structures. Logic elements in the one or more areas of the initial logic design representation are replaced with multiplexer tree structures to generate a modified logic design representation. The modified logic design representation is output to a physical synthesis system to generate a physical layout of the integrated circuit device based on the modified logic design representation.

Abstract: Mechanisms are provided for generating a logic design of an integrated circuit device. An initial logic design representation of the integrated circuit device is received and one or more areas of the initial logic design representation are identified where logic elements in the one or more areas can be replaced with one or more multiplexer tree structures. Logic elements in the one or more areas of the initial logic design representation are replaced with multiplexer tree structures to generate a modified logic design representation. The modified logic design representation is output to a physical synthesis system to generate a physical layout of the integrated circuit device based on the modified logic design representation.

Abstract: Exemplary embodiments include a computer implemented method for large block and structured synthesis, the method including determining initial design data from starting points for a synthesis flow, receiving user-directed structuring is incorporated into the synthesis flow, applying logical synthesis on the initial design data, applying a physical design on the initial design data, determining whether circuit design parameters have been met and in response to circuit design parameters not being met, adjusting the circuit design parameters.

Abstract: Exemplary embodiments include a computer implemented method for large block and structured synthesis, the method including determining initial design data from starting points for a synthesis flow, receiving user-directed structuring is incorporated into the synthesis flow, applying logical synthesis on the initial design data, applying a physical design on the initial design data, determining whether circuit design parameters have been met and in response to circuit design parameters not being met, adjusting the circuit design parameters.

Abstract: Disclosed is a method, system and computer program product to specify an integrated circuit. The integrated circuit includes a hardwired specific logic technology portion and a programmable specific logic technology portion. The method includes generating a hybrid logic network by mapping each uncertain logic function to an abstract programmable logic element implementation thereof and by mapping each known logic function to a technology-independent logic element implementation thereof; simplifying the hybrid logic network using logic synthesis optimizations; mapping the simplified hybrid logic network to a specific technology by mapping the abstract programmable logic element implementation to the specific programmable logic technology and the technology-independent logic element implementation to the specific logic technology; and further includes optimizing the mapped network to meet performance constraints.

Abstract: Disclosed is a method, system and computer program product to specify an integrated circuit. The integrated circuit includes a hardwired specific logic technology portion and a programmable specific logic technology portion. The method includes generating a hybrid logic network by mapping each uncertain logic function to an abstract programmable logic element implementation thereof and by mapping each known logic function to a technology-independent logic element implementation thereof; simplifying the hybrid logic network using logic synthesis optimizations; mapping the simplified hybrid logic network to a specific technology by mapping the abstract programmable logic element implementation to the specific programmable logic technology and the technology-independent logic element implementation to the specific logic technology; and further includes optimizing the mapped network to meet performance constraints.

Abstract: Disclosed is a method, system and computer program product to specify an integrated circuit. The integrated circuit includes a hardwired specific logic technology portion and a programmable specific logic technology portion. The method includes generating a hybrid logic network by mapping each uncertain logic function to an abstract programmable logic element implementation thereof and by mapping each known logic function to a technology-independent logic element implementation thereof; simplifying the hybrid logic network using logic synthesis optimizations; mapping the simplified hybrid logic network to a specific technology by mapping the abstract programmable logic element implementation to the specific programmable logic technology and the technology-independent logic element implementation to the specific logic technology; and further includes optimizing the mapped network to meet performance constraints.

Abstract: Disclosed is a method, system and computer program product to specify an integrated circuit. The integrated circuit includes a hardwired specific logic technology portion and a programmable specific logic technology portion. The method includes generating a hybrid logic network by mapping each uncertain logic function to an abstract programmable logic element implementation thereof and by mapping each known logic function to a technology-independent logic element implementation thereof; simplifying the hybrid logic network using logic synthesis optimizations; mapping the simplified hybrid logic network to a specific technology by mapping the abstract programmable logic element implementation to the specific programmable logic technology and the technology-independent logic element implementation to the specific logic technology; and further includes optimizing the mapped network to meet performance constraints.